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 | 2010 | |
|---|---|---|
| j2 |      | Sandeep Sangameswaran, Jeroen De Coster, Guido Groeseneken, Ingrid De Wolf: Impact of design factors and environment on the ESD sensitivity of MEMS micromirrors. Microelectronics Reliability 50(9-11): 1383-1387 (2010) |
| 2009 | ||
| j1 | | Mirko Scholz, Dimitri Linten, Steven Thijs, Sandeep Sangameswaran, Masanori Sawada, Toshiyuki Nakaei, Takumi Hasebe, Guido Groeseneken: ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool? IEEE T. Instrumentation and Measurement 58(10): 3418-3426 (2009) |
| 1 | Jeroen De Coster | |
| 2 | Guido Groeseneken | |
| 3 | Takumi Hasebe | |
| 4 | Dimitri Linten | |
| 5 | Toshiyuki Nakaei | |
| 6 | Masanori Sawada | |
| 7 | Mirko Scholz | |
| 8 | Steven Thijs | |
| 9 | Ingrid De Wolf |
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