Peter Ryser

Karol Malecha, Thomas Maeder, Caroline Jacq, Peter Ryser: Structuration of the low temperature co-fired ceramics (LTCC) using novel sacrificial graphite paste with PVA-propylene glycol-glycerol-water vehicle. Microelectronics Reliability 51(4): 805-811 (2011)

Thomas Maeder, Yannick Fournier, Jean-Bastien Coma, Nicolas Craquelin, Peter Ryser: Integrated SMD pressure/flow/temperature multisensor for compressed air in LTCC technology: Thermal flow and temperature sensing. Microelectronics Reliability 51(7): 1245-1249 (2011)

Christophe Boss, Eric Meurville, Peter Ryser, Frédéric Schmitt, Lucienne Juillerat-Jeanneret, Pablo Dosil-Rosende, Desdemona De Souza: Multi-analyte Detection for Biological Fluids - Towards Continous Monitoring of Glucose, Ionized Calcium and pH using a Viscometric Affinity Biosensor. BIODEVICES 2011: 295-298

Arash Arami, Matteo Simoncini, Oguz Atasoy, Willyan Hasenkamp, Shafqat Ali, Arnaud Bertsch, Eric Meurville, Steve Tanner, Hooman Dejnabadi, Vincent Leclercq, Philippe Renaud, Catherine Dehollain, Pierre-André Farine, Brigitte M. Jolles, Kamiar Aminian, Peter Ryser: Instrumented prosthesis for knee implants monitoring. CASE 2011: 828-835

Thomas Maeder, Grégory Affolter, Niklaus Johner, Giancarlo Corradini, Peter Ryser: Optimisation of a thick-film 10-400 N force sensor. Microelectronics Reliability 48(6): 902-905 (2008)

Gaël Richard, Yann Menguy, I. Guis, N. Suaudeau, Jérôme Boudy, Philip Lockwood, C. Fernández, F. Fernández, Constantine Kotropoulos, Anastasios Tefas, Ioannis Pitas, R. Heimgartner, Peter Ryser, Charles Beumier, Patrick Verlinde, Steven Pigeon, George Matas, Josef Kittler, Josef Bigün, Yousri Abdeljaoued, Eric Meurville, Laurent Besacier, Michael Ansorge, Gilbert Maître, Juergen Luettin, S. Ben-Yacoub, Belén Ruíz, K. Aldama, J. Cortes: Multi Modal Verification for Teleservices and Security Applications (M2VTS). ICMCS, Vol. 2 1999: 1061-1064