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F. Roqueta

2000 – 2009

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2009
[j2]
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  dblp key:
  - journals/mr/DiattaBTMROB09
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M. Diatta, E. Bouyssou, D. Trémouilles, P. Martinez, F. Roqueta, O. Ory, M. Bafleur: Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). Microelectronics Reliability 49(9-11): 1103-1106 (2009)
2007
[j1]
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  - journals/mr/MoraisARR07
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L. Dantas de Morais, F. Allanic, F. Roqueta, J. P. Rebrasse: Thermal approach of defects generation on copper/organic dielectric interface due to SEM inspections. Microelectronics Reliability 47(9-11): 1614-1618 (2007)

Coauthor Index

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