Jeffrey L. Roehr pubzone.org

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DBLP keys2007
c4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jeffrey L. Roehr: Measurement ratio testing for improved quality and outlier detection. ITC 2007: 1-10
2006
c3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jeffrey L. Roehr: Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection. ITC 2006: 1-6
2005
c2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jeffrey L. Roehr: The case for outsourcing DFT. ITC 2005: 1
1999
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jeffrey L. Roehr: Thin Gate Oxide Reliability. ITC 1999: 1122
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