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Semantic ScholarBruno Riccò
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- affiliation: University of Bologna, Italy
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2010 – today
- 2016
[c63]Marco Marchesi, Bruno Riccò:
GLOVR: a wearable hand controller for virtual reality applications. VRIC 2016: 18:1-18:2- 2013
- [c62]Marco Marchesi, Bruno Riccò:
BRAVO: a brain virtual operator for education exploiting brain-computer interfaces. CHI Extended Abstracts 2013: 3091-3094 - [c61]Marco Marchesi, Bruno Riccò:
Augmented graphics for interactive storytelling on a mobile device. SIGGRAPH ASIA Mobile Graphics and Interactive Applications 2013: 59:1 - 2010
- [j36]Elisabetta Farella, Mirko Falavigna, Bruno Riccò:
Aware and smart environments: The Casattenta project. Microelectronics Journal 41(11): 697-702 (2010) - [j35]Sandro Carrara, Andrea Cavallini, Yusuf Leblebici, Giovanni De Micheli, Vijayender Bhalla, Francesco Valle, Bruno Samorì, Luca Benini, Bruno Riccò, Inger Vikholm-Lundin, Tony Munter:
Capacitance DNA bio-chips improved by new probe immobilization strategies. Microelectronics Journal 41(11): 711-717 (2010)
2000 – 2009
- 2009
- [j34]Daniela De Venuto, Bruno Riccò:
Fault diagnosis and test of DNA sensor arrays by using IFA approach. Microelectronics Journal 40(9): 1293-1299 (2009) - [j33]Massimo Lanzoni, Claudio Stagni, Bruno Riccò:
Smart sensors for fast biological analysis. Microelectronics Journal 40(9): 1345-1349 (2009) - [j32]Daniela De Venuto, Sandro Carrara, Bruno Riccò:
Design of an integrated low-noise read-out system for DNA capacitive sensors. Microelectronics Journal 40(9): 1358-1365 (2009) - 2008
- [c60]Daniela De Venuto, Bruno Riccò:
High Resolution Read-Out Circuit for DNA Label-Free Detection System. ISQED 2008: 708-711 - [c59]Elisabetta Farella, Omar Cafini, Luca Benini, Bruno Riccò:
A smart wireless glove for gesture interaction. SIGGRAPH Posters 2008: 44 - 2007
- [j31]Elisabetta Farella, Luca Benini, Bruno Riccò, Andrea Acquaviva:
MOCA: A Low-Power, Low-Cost Motion Capture System Based on Integrated Accelerometers. Adv. in MM 2007: 82638:1-82638:11 (2007) - [c58]Daniela De Venuto, Bruno Riccò:
Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays. ISQED 2007: 311-316 - 2006
- [j30]Daniela De Venuto, Bruno Riccò:
Design and characterization of novel read-out systems for a capacitive DNA sensor. Microelectronics Journal 37(12): 1610-1619 (2006) - [j29]Fabio Cibin, Massimo Lanzoni, Luca Benini, Bruno Riccò:
Linux-Based Data Acquisition and Processing on Palmtop Computer. IEEE Trans. Instrumentation and Measurement 55(6): 2039-2044 (2006) - [c57]Michele Sama, Vincenzo Pacella, Elisabetta Farella, Luca Benini, Bruno Riccò:
3dID: a low-power, low-cost hand motion capture device. DATE Designers' Forum 2006: 136-141 - [c56]Elisabetta Farella, M. Sile O'Modhrain, Luca Benini, Bruno Riccò:
Gesture Signature for Ambient Intelligence Applications: A Feasibility Study. Pervasive 2006: 288-304 - [c55]Carlotta Guiducci, Claudio Stagni, M. Brocchi, Massimo Lanzoni, Bruno Riccò, Augusto Nascetti, Davide Caputo, A. De Cesare:
Innovative Optoeletronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices. VLSI-SoC (Selected Papers) 2006: 37-53 - [c54]Carlotta Guiducci, Claudio Stagni, M. Brocchi, Massimo Lanzoni, Bruno Riccò, Augusto Nascetti, Davide Caputo, Giampiero de Cesare:
Innovative Optoelectronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices. VLSI-SoC 2006: 169-174 - 2005
- [j28]Elisabetta Farella, Davide Brunelli, Luca Benini, Bruno Riccò, Maria Elena Bonfigli:
Pervasive Computing for Interactive Virtual Heritage. IEEE MultiMedia 12(3): 46-58 (2005) - [c53]Claudio Stagni, Carlotta Guiducci, Massimo Lanzoni, Luca Benini, Bruno Riccò:
Hardware-Software Design of a Smart Sensor for Fully-Electronic DNA Hybridization Detection. DATE 2005: 198-203 - [c52]Elisabetta Farella, Augusto Pieracci, Davide Brunelli, Luca Benini, Bruno Riccò, Andrea Acquaviva:
Design and Implementation of WiMoCA Node for a Body Area Wireless Sensor Network. Systems Communications 2005: 342-347 - 2003
- [j27]Cecilia Metra, Stefano Di Francescantonio, Michele Favalli, Bruno Riccò:
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults. Microelectronics Journal 34(1): 23-29 (2003) - [c51]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Self-positioning digital window comparators for mixed-signal DfT. ETFA (1) 2003: 438-443 - [c50]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes. ISQED 2003: 431-437 - 2002
- [j26]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Digital Window Comparator DfT Scheme for Mixed-Signal ICs. J. Electronic Testing 18(2): 121-128 (2002) - [j25]Cecilia Metra, Michele Favalli, Stefano Di Francescantonio, Bruno Riccò:
On-Chip Clock Faults' Detector. J. Electronic Testing 18(4-5): 555-564 (2002) - [j24]Ruggero Feruglio, Fernanda Irrera, Bruno Riccò:
Microscopic aspects of defect generation in SiO2. Microelectronics Reliability 42(9-11): 1427-1432 (2002) - [c49]Franco Gatti, Andrea Acquaviva, Luca Benini, Bruno Riccò:
Low Power Control Techniques For TFT LCD Displays. CASES 2002: 218-224 - [c48]Davide Bruni, Luca Benini, Bruno Riccò:
System lifetime extension by battery management: an experimental work. CASES 2002: 232-237 - [c47]Cecilia Metra, Luca Schiano, Bruno Riccò, Michele Favalli:
Self-Checking Scheme for the On-Line Testing of Power Supply Noise. DATE 2002: 832-836 - [c46]Luigi Biagiotti, M. Gavesi, Claudio Melchiorri, Bruno Riccò:
A New Stress Sensor for Force/Torque Measurements. ICRA 2002: 1655-1660 - [c45]Daniele Rossi, Cecilia Metra, Bruno Riccò:
Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories. IOLTW 2002: 221-225 - [c44]Elisa Ficarra, Luca Benini, Bruno Riccò, Giampaolo Zuccheri:
Automated DNA sizing in atomic force microscope images. ISBI 2002: 453-456 - [c43]Davide Bertozzi, Luca Benini, Bruno Riccò:
Energy-efficient and reliable low-swing signaling for on-chip buses based on redundant coding. ISCAS (1) 2002: 93-96 - [c42]Luca Benini, Davide Bruni, Bruno Riccò, Alberto Macii, Enrico Macii:
An adaptive data compression scheme for memory traffic minimization in processor-based systems. ISCAS (4) 2002: 866-869 - [c41]Davide Bertozzi, Luca Benini, Bruno Riccò:
Parametric timing and power macromodels for high level simulation of low-swing interconnects. ISLPED 2002: 307-312 - [c40]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Testing of Analogue Circuits via (Standard) Digital Gates. ISQED 2002: 112-119 - [c39]Daniele Rossi, Cecilia Metra, Bruno Riccò:
Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories. MTDT 2002: 27-31 - [c38]Davide Bertozzi, Luca Benini, Bruno Riccò:
Power aware network interface management for streaming multimedia. WCNC 2002: 926-930 - 2001
- [j23]Andrea Acquaviva, Luca Benini, Bruno Riccò:
Energy characterization of embedded real-time operating systems. SIGARCH Computer Architecture News 29(5): 13-18 (2001) - [j22]Andrea Acquaviva, Luca Benini, Bruno Riccò:
Software-controlled processor speed setting for low-power streamingmultimedia. IEEE Trans. on CAD of Integrated Circuits and Systems 20(11): 1283-1292 (2001) - [c37]Andrea Acquaviva, Luca Benini, Bruno Riccò:
Processor frequency setting for energy minimization of streaming multimedia application. CODES 2001: 249-253 - [c36]Andrea Acquaviva, Luca Benini, Bruno Riccò:
An adaptive algorithm for low-power streaming multimedia processing. DATE 2001: 273-279 - [c35]Cecilia Metra, Stefano Di Francescantonio, Bruno Riccò, T. M. Mak:
Evaluation of Clock Distribution Networks' Most Likely Faults and Produced Effects. DFT 2001: 357-365 - [c34]Cecilia Metra, Andrea Pagano, Bruno Riccò:
On-line testing of transient and crosstalk faults affecting interconnections of FPGA-implemented systems. ITC 2001: 939-947 - 2000
- [j21]Cecilia Metra, Michele Favalli, Bruno Riccò:
Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines. IEEE Trans. Computers 49(6): 560-574 (2000) - [c33]Cecilia Metra, Michele Favalli, Bruno Riccò:
On-Line Testing and Diagnosis of Bus Lines with respect to Intermediate Voltage Values. DATE 2000: 763
1990 – 1999
- 1999
- [c32]Alessandro Bogliolo, Luca Benini, Bruno Riccò, Giovanni De Micheli:
Efficient switching activity computation during high-level synthesis of control-dominated designs. ISLPED 1999: 127-132 - [c31]Cecilia Metra, Flavio Giovanelli, Mani Soma, Bruno Riccò:
Self-checking scheme for very fast clocks' skew correction. ITC 1999: 652-661 - 1998
- [j20]Cecilia Metra, Michele Favalli, Bruno Riccò:
Concurrent Checking of Clock Signal Correctness. IEEE Design & Test of Computers 15(4): 42-48 (1998) - [c30]Cecilia Metra, Michele Favalli, Bruno Riccò:
Highly Testable and Compact 1-out-of-n Code Checker with Single Output. DATE 1998: 981-982 - [c29]Cecilia Metra, Michele Favalli, Bruno Riccò:
Signal Coding Technique and CMOS Gates for Strongly Fault-Secure Combinational Functional Blocks. DFT 1998: 174-182 - [c28]Luca Benini, Alessandro Bogliolo, Stefano Cavallucci, Bruno Riccò:
Monitoring system activity for OS-directed dynamic power management. ISLPED 1998: 185-190 - [c27]Cecilia Metra, Michele Favalli, Bruno Riccò:
On-line detection of logic errors due to crosstalk, delay, and transient faults. ITC 1998: 524-533 - 1997
- [j19]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 770-776 (1997) - [j18]Alessandro Bogliolo, Luca Benini, Giovanni De Micheli, Bruno Riccò:
Gate-level power and current simulation of CMOS integrated circuits. IEEE Trans. VLSI Syst. 5(4): 473-488 (1997) - [c26]Cecilia Metra, Michele Favalli, Bruno Riccò:
Compact and low power on-line self-testing voting scheme. DFT 1997: 137-147 - [c25]Cecilia Metra, Michele Favalli, Bruno Riccò:
On-Line Testing Scheme for Clock's Faults. ITC 1997: 587-596 - [c24]Cecilia Metra, Michele Favalli, Bruno Riccò:
Highly testable and compact single output comparator. VTS 1997: 210-215 - 1996
- [c23]Alessandro Bogliolo, Luca Benini, Bruno Riccò:
Power Estimation of Cell-Based CMOS Circuits. DAC 1996: 433-438 - [c22]Cecilia Metra, Michele Favalli, Bruno Riccò:
Compact and Highly Testable Error Indicator for Self-Checking Circuits. DFT 1996: 204-212 - [c21]Cecilia Metra, Michele Favalli, Bruno Riccò:
Tree Checkers for Applications with Low Power-Delay Requirements. DFT 1996: 213-220 - [c20]Alessandro Bogliolo, Luca Benini, Giovanni De Micheli, Bruno Riccò:
Gate-level current waveform simulation of CMOS integrated circuits. ISLPED 1996: 109-112 - [c19]Cecilia Metra, Michele Favalli, Bruno Riccò:
Embedded two-rail checkers with on-line testing ability. VTS 1996: 145-150 - 1995
- [j17]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults. J. Electronic Testing 6(1): 7-22 (1995) - [c18]Michele Favalli, Bruno Riccò, L. Penza:
A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs. ED&TC 1995: 599 - [c17]
- [c16]Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Riccò:
Reliability evaluation of combinational logic circuits by symbolic simulation. VTS 1995: 235-243 - 1994
- [c15]Cecilia Metra, Michele Favalli, Bruno Riccò:
CMOS Self Checking Circuits with Faulty Sequential Functional Block. DFT 1994: 133-141 - [c14]Cecilia Metra, Michele Favalli, Bruno Riccò:
Highly Testable and Compact 1-out-of-n CMOS Checkers. DFT 1994: 142-150 - [c13]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Modeling of Broken Connections Faults in CMOS ICs. EDAC-ETC-EUROASIC 1994: 159-164 - 1993
- [j16]Antonio Abramo, Franco Venturi, Enrico Sangiorgi, Jack M. Higman, Bruno Riccò:
A numerical method to compute isotropic band models from anisotropic semiconductor band structures. IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1327-1336 (1993) - [j15]Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò:
Fault simulation of parametric bridging faults in CMOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1403-1410 (1993) - [j14]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analysis of resistive bridging fault detection in BiCMOS digital ICs. IEEE Trans. VLSI Syst. 1(3): 342-355 (1993) - [c12]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block. DFT 1993: 271-278 - [c11]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
A Highly Testable 1-out-of-3 CMOS Checker. DFT 1993: 279-286 - [c10]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. ITC 1993: 865-874 - 1992
- [j13]Michele Favalli, Piero Olivo, Bruno Riccò:
Dynamic effects in the detection of bridging faults in CMOS ICs. J. Electronic Testing 3(3): 197-205 (1992) - [j12]Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò:
Testability measures in pseudorandom testing. IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 794-800 (1992) - [j11]Michele Favalli, Piero Olivo, Bruno Riccò:
A probabilistic fault model for 'analog' faults in digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1459-1462 (1992) - [c9]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. ITC 1992: 466-475 - [c8]Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò:
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. ITC 1992: 486-495 - [c7]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. ITC 1992: 948-957 - 1991
- [j10]Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi:
Fault simulation for general FCMOS ICs. J. Electronic Testing 2(2): 181-190 (1991) - [j9]Maurizio Damiani, Piero Olivo, Bruno Riccò:
Analysis and Design of Linear Finite State Machines for Signature Analysis Testing. IEEE Trans. Computers 40(9): 1034-1045 (1991) - [j8]Michele Favalli, Piero Olivo, Bruno Riccò:
A novel critical path heuristic for fast fault grading. IEEE Trans. on CAD of Integrated Circuits and Systems 10(4): 544-548 (1991) - [j7]Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò:
Fault simulation of unconventional faults in CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(5): 677-682 (1991) - [j6]Franco Venturi, Enrico Sangiorgi, Rossella Brunetti, Wolfgang Quade, Carlo Jacoboni, Bruno Riccò:
Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's. IEEE Trans. on CAD of Integrated Circuits and Systems 10(10): 1276-1286 (1991) - [c6]M. Ambanelli, Michele Favalli, Piero Olivo, Bruno Riccò:
Detection of PLA multiple crosspoint faults. EURO-DAC 1991: 80-84 - [c5]Michele Favalli, Piero Olivo, Bruno Riccò:
A probabilistic fault model for analog faults. EURO-DAC 1991: 85-88 - 1990
- [j5]Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt:
Testing of E2PROM aging and endurance: A case study. European Transactions on Telecommunications 1(2): 201-207 (1990) - [j4]Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò:
Aliasing in signature analysis testing with multiple input shift registers. IEEE Trans. on CAD of Integrated Circuits and Systems 9(12): 1344-1353 (1990) - [c4]Roberto Menozzi, Mattia Lanzoni, Luca Selmi, Bruno Riccò:
An improved procedure to test CMOS ICs for latch-up. ITC 1990: 1028-1034
1980 – 1989
- 1989
- [j3]Franco Venturi, R. Kent Smith, Enrico Sangiorgi, Mark R. Pinto, Bruno Riccò:
A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs. IEEE Trans. on CAD of Integrated Circuits and Systems 8(4): 360-369 (1989) - [j2]Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò:
An analytical model for the aliasing probability in signature analysis testing. IEEE Trans. on CAD of Integrated Circuits and Systems 8(11): 1133-1144 (1989) - [c3]Mattia Lanzoni, Piero Olivo, Bruno Riccò:
A Testing Technique to Characterize E^2PROM's Aging and Endurance. ITC 1989: 391-396 - [c2]Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò:
CMOS Design for Improved IC Testability. ITC 1989: 934 - [c1]Piero Olivo, Maurizio Damiani, Bruno Riccò:
On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing. ITC 1989: 936 - 1988
- [j1]Enrico Sangiorgi, Bruno Riccò, Franco Venturi:
MOS2: an efficient MOnte Carlo Simulator for MOS devices. IEEE Trans. on CAD of Integrated Circuits and Systems 7(2): 259-271 (1988)
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last updated on 2018-04-26 16:02 CEST by the dblp team