H. Rathore

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	2006
j1		F. Chen, J. Gill, D. Harmon, T. Sullivan, A. Strong, B. Li, H. Rathore, Daniel C. Edelstein: Determination of the thermal conductivity of composite low-k dielectrics for advanced interconnect structures. Microelectronics Reliability 46(2-4): 232-243 (2006)

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