| 2002 | ||
|---|---|---|
| c1 | Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner: Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682 | |
| 1 | W. Robert Daasch | |
| 2 | B. H. Goh | |
| 3 | C. Macchietto | |
| 4 | Robert Madge | |
| 5 | Chris Schuermyer | |
| 6 | C. Taylor | |
| 7 | David Turner |
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