Osei Poku

R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku: Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Design & Test of Computers 29(1): 36-47 (2012)

Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar: Physically-Aware N-Detect Test. IEEE Trans. on CAD of Integrated Circuits and Systems 31(2): 308-321 (2012)

Hongfei Wang, Osei Poku, Xiaochun Yu, Sizhe Liu, Ibrahima Komara, Ronald D. Blanton: Test-data volume optimization for diagnosis. DAC 2012: 567-572

Wing Chiu Tam, Osei Poku, Ronald D. Blanton: Systematic defect identification through layout snippet clustering. ITC 2010: 378-387

Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton: Automated failure population creation for validating integrated circuit diagnosis methods. DAC 2009: 708-713

Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton: Controlling DPPM through Volume Diagnosis. VTS 2009: 134-139

Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton: Precise failure localization using automated layout analysis of diagnosis candidates. DAC 2008: 367-372

Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton: Physically-Aware N-Detect Test Pattern Selection. DATE 2008: 634-639

Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar: Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC 2008: 1-9

Osei Poku, Ronald D. Blanton: Delay defect diagnosis using segment network faults. ITC 2007: 1-10

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)

Rao Desineni, Osei Poku, Ronald D. Blanton: A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. ITC 2006: 1-10