Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
R. Pichler
2000 – 2009
- 2001
[j2]Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner: Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability 41(9-10): 1385-1390 (2001)
[j1]Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, G. Groos, Matthias Stecher: Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability 41(9-10): 1501-1506 (2001)
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2012-09-10 15:57 CEST by the dblp team



