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 | 2009 | |
|---|---|---|
| j1 |      | Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa: Laser THz emission microscope as a novel tool for LSI failure analysis. Microelectronics Reliability 49(9-11): 1116-1126 (2009) |
| 1 | Sunmi Kim | |
| 2 | Toru Matsumoto | |
| 3 | Yoshihiro Midoh | |
| 4 | Katsuyoshi Miura | |
| 5 | Hironaru Murakami | |
| 6 | Koji Nakamae | |
| 7 | Kiyoshi Nikawa | |
| 8 | Masayoshi Tonouchi | |
| 9 | Masatsugu Yamashita |
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