Marvin Onabajo

Peter Grossmann, Miriam Leeser, Marvin Onabajo: Minimum energy operation for clustered island-style FPGAs. FPGA 2013: 157-166

Peter Grossmann, Miriam Leeser, Marvin Onabajo: Minimum Energy Analysis and Experimental Verification of a Latch-Based Subthreshold FPGA. IEEE Trans. on Circuits and Systems 59-II(12): 942-946 (2012)

Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez: Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. J. Electronic Testing 27(3): 225-240 (2011)

Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez: Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. IEEE Trans. on Circuits and Systems 58-I(3): 458-469 (2011)

Mohamed Mobarak, Marvin Onabajo, José Silva-Martínez, Edgar Sánchez-Sinencio: Attenuation-Predistortion Linearization of CMOS OTAs With Digital Correction of Process Variations in OTA-C Filter Applications. J. Solid-State Circuits 45(2): 351-367 (2010)

Cho-Ying Lu, Marvin Onabajo, Venkata Gadde, Yung-Chung Lo, Hsien-Pu Chen, Vijayaramalingam Periasamy, José Silva-Martínez: A 25 MHz Bandwidth 5th-Order Continuous-Time Low-Pass Sigma-Delta Modulator With 67.7 dB SNDR Using Time-Domain Quantization and Feedback. J. Solid-State Circuits 45(9): 1795-1808 (2010)

Marvin Onabajo, José Silva-Martínez, Félix O. Fernandez-Rodriguez, Edgar Sánchez-Sinencio: An On-Chip Loopback Block for RF Transceiver Built-In Test. IEEE Trans. on Circuits and Systems 56-II(6): 444-448 (2009)

Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez: Non-invasive RF built-in testing using on-chip temperature sensors. ITC 2009: 1

Xiaohua Fan, Marvin Onabajo, Félix O. Fernandez-Rodriguez, José Silva-Martínez, Edgar Sánchez-Sinencio: A Current Injection Built-In Test Technique for RF Low-Noise Amplifiers. IEEE Trans. on Circuits and Systems 55-I(7): 1794-1804 (2008)