Wayne M. Needham

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	1999
j2		Wayne M. Needham: Nanometer Technology Challenges for Test and Test Equipment. IEEE Computer 32(11): 52-57 (1999)
	1998
j1		Wayne M. Needham: Guest Editor's Introduction: Microprocessor Testing Today. IEEE Design & Test of Computers 15(3): 56-57 (1998)
c7		Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong: High volume microprocessor test escapes, an analysis of defects our tests are missing. ITC 1998: 25-34
c6		Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh: Best Methods for At-Speed Testing? VTS 1998: 460-461
	1997
c5		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
c4		Wayne M. Needham: Just how real is the SIA roadmap. ITC 1997: 1151
c3		Magdy S. Abadir, Jacob A. Abraham, H. Hao, C. Hunter, Wayne M. Needham, Ron G. Walther: Microprocessor Test and Validation: Any New Avenues? VTS 1997: 458-464
c2		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
	1996
c1		Wayne M. Needham, Naga Gollakota: DFT Strategy for Intel Microprocessors. ITC 1996: 396-399

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