Toru Nakura

Jinmyoung Kim, Toru Nakura, Koichiro Ishibashi, Makoto Ikeda, Kunihiro Asada: On-Chip Switched Decoupling Capacitor for Fast Voltage Hopping of DVS Systems. IEICE Transactions 96-C(4): 560-567 (2013)

Toru Nakura, Kunihiro Asada: Low Pass Filter-Less Pulse Width Controlled PLL Using Time to Soft Thermometer Code Converter. IEICE Transactions 95-C(2): 297-302 (2012)

Jinmyoung Kim, Toru Nakura, Hidehiro Takata, Koichiro Ishibashi, Makoto Ikeda, Kunihiro Asada: On-Chip Switched Parasitic Capacitors of Sleep Blocks for Resonant Supply Noise Reduction. IEICE Transactions 95-C(4): 643-650 (2012)

Kazutoshi Kodama, Tetsuya Iizuka, Toru Nakura, Kunihiro Asada: Frequency Resolution Enhancement for Digitally-Controlled Oscillator Based on a Single-Period Switching Scheme. IEICE Transactions 95-C(12): 1857-1863 (2012)

Toru Nakura, Tetsuya Iizuka, Kunihiro Asada: Impact of All-Digital PLL on SoC Testing. Asian Test Symposium 2012: 252-257

Toru Nakura, Yoshio Mita, Tetsuya Iizuka, Kunihiro Asada: 7.5Vmax arbitrary waveform generator with 65nm standard CMOS under 1.2V supply voltage. CICC 2012: 1-4

Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada: Power integrity control of ATE for emulating power supply fluctuations on customer environment. ITC 2012: 1-10

Tetsuya Iizuka, Jaehyun Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada: All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter. IEICE Transactions 94-C(4): 487-494 (2011)

Jinmyoung Kim, Toru Nakura, Hidehiro Takata, Koichiro Ishibashi, Makoto Ikeda, Kunihiro Asada: On-Chip Resonant Supply Noise Canceller Utilizing Parasitic Capacitance of Sleep Blocks for Power Mode Switch. IEICE Transactions 94-C(4): 511-519 (2011)

Shingo Mandai, Toru Nakura, Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada: Cascaded Time Difference Amplifier with Differential Logic Delay Cell. IEICE Transactions 94-C(4): 654-662 (2011)

Shingo Mandai, Tetsuya Iizuka, Toru Nakura, Makoto Ikeda, Kunihiro Asada: 1.0 ps Resolution Time-to-Digital Converter Based-On Cascaded Time-Difference-Amplifier Utilizing Differential Logic Delay Cells. IEICE Transactions 94-C(6): 1098-1104 (2011)

Jaehyun Jeong, Tetsuya Iizuka, Toru Nakura, Makoto Ikeda, Kunihiro Asada: All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter. ASP-DAC 2011: 79-80

Jinmyoung Kim, Toru Nakura, Hidehiro Takata, Koichiro Ishibashi, Makoto Ikeda, Kunihiro Asada: Decoupling capacitance boosting for on-chip resonant supply noise reduction. DDECS 2011: 111-114

Jinmyoung Kim, Toru Nakura, Hidehiro Takata, Koichiro Ishibashi, Makoto Ikeda, Kunihiro Asada: On-chip resonant supply noise reduction utilizing switched parasitic capacitors of sleep blocks with tri-mode power gating structure. ESSCIRC 2011: 183-186

Toru Nakura, Shingo Mandai, Makoto Ikeda, Kunihiro Asada: Time Difference Amplifier with Robust Gain Using Closed-Loop Control. IEICE Transactions 93-C(3): 303-308 (2010)

Benjamin Stefan Devlin, Toru Nakura, Makoto Ikeda, Kunihiro Asada: A Low Power and High Throughput Self Synchronous FPGA Using 65 nm CMOS with Throughput Optimization by Pipeline Alignment. IEICE Transactions 93-A(7): 1319-1328 (2010)

Shingo Mandai, Toru Nakura, Makoto Ikeda, Kunihiro Asada: Cascaded time difference amplifier using differential logic delay cell. ASP-DAC 2010: 355-356

Tetsuya Iizuka, Toru Nakura, Kunihiro Asada: Buffer-ring-based all-digital on-chip monitor for PMOS and NMOS process variability and aging effects. DDECS 2010: 167-172

Shingo Mandai, Toru Nakura, Makoto Ikeda, Kunihiro Asada: Dual Imager Core Chip with 24.8 Rangemaps/s 3-D and 58 fps 2-D Simultaneous Capture Capability. IEICE Transactions 92-C(6): 798-805 (2009)

Kunihiro Asada, Taku Sogabe, Toru Nakura, Makoto Ikeda: Measurement of power supply noise tolerance of self-timed processor. DDECS 2009: 128-131

Sanad Bushnaq, Toru Nakura, Makoto Ikeda, Kunihiro Asada: All digital baseband 50 Mbps data recovery using 5× oversampling with 0.9 data unit interval clock jitter tolerance. DDECS 2009: 206-209

MyeongGyu Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada: Moebius circuit: dual-rail dynamic logic for logic gate level pipeline with error gate search feature. ACM Great Lakes Symposium on VLSI 2009: 177-180

Taisuke Kazama, Toru Nakura, Makoto Ikeda, Kunihiro Asada: Design of Active Substrate Noise Canceller using Power Supply di/dt Detector. ASP-DAC 2007: 100-101

Toru Nakura, Makoto Ikeda, Kunihiro Asada: Feedforward Active Substrate Noise Cancelling Based on di/dt of Power Supply. IEICE Transactions 89-C(3): 364-369 (2006)

Toru Nakura, Makoto Ikeda, Kunihiro Asada: Autonomous di/dt Control of Power Supply for Margin Aware Operation. IEICE Transactions 89-C(11): 1689-1694 (2006)

Toru Nakura, Makoto Ikeda, Kunihiro Asada: Stub vs. Capacitor for Power Supply Noise Reduction. IEICE Transactions 88-C(1): 125-132 (2005)

Toru Nakura, Makoto Ikeda, Kunihiro Asada: On-chip di/dt Detector Circuit. IEICE Transactions 88-C(5): 782-787 (2005)

Toru Nakura, Makoto Ikeda, Kunihiro Asada: Preliminary Experiments for Power Supply Noise Reduction Using On-Board Stubs. IEICE Transactions 88-C(8): 1734-1739 (2005)