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 | 2001 | |
|---|---|---|
| j4 |      | Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip: Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST. IEEE T. Instrumentation and Measurement 50(2): 349-352 (2001) |
| j3 | | Reinoud F. Wolffenbuttel, Cees J. van Mullem: Guest editorial. IEEE T. Instrumentation and Measurement 50(6): 1467-1468 (2001) |
| j2 | | Reinoud F. Wolffenbuttel, Cees J. van Mullem: The relationship between microsystem technology and metrology. IEEE T. Instrumentation and Measurement 50(6): 1469-1474 (2001) |
| j1 | | Ger de Graaf, Marian Bartek, Zhixiong Xiao, Cees J. van Mullem, Reinoud F. Wolffenbuttel: Bulk micromachined electrostatic RMS-to-DC converter. IEEE T. Instrumentation and Measurement 50(6): 1508-1512 (2001) |
| 1 | Marian Bartek | |
| 2 | Piotr S. Filipski | |
| 3 | Ger de Graaf | |
| 4 | David Janik | |
| 5 | Joseph R. Kinard | |
| 6 | Manfred Klonz | |
| 7 | Thomas E. Lipe | |
| 8 | Bryan C. Waltrip | |
| 9 | Reinoud F. Wolffenbuttel | |
| 10 | Zhixiong Xiao |
Colors in the list of coauthors
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