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Richard Morren

2010 – today

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2010
[c5]
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  dblp key:
  - conf/itc/WaayersMLK10
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Tom Waayers, Richard Morren, Xijiang Lin, Mark Kassab: Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains. ITC 2010: 114-123

2000 – 2009

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2005
[c4]
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  - conf/itc/WaayersMG05
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Tom Waayers, Richard Morren, Roberto Grandi: Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain. ITC 2005: 10

1990 – 1999

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1993
[c3]
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  dblp key:
  - conf/itc/MehtaniAJMSZ93
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R. Mehtani, B. Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra: Mix Test: A Mixed-Signal Extension to a Digital Test System. ITC 1993: 945-953
1992
[c2]
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  - conf/itc/VerhelstMB92
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Bas Verhelst, Richard Morren, Keith Baker: Using EDIF for Transfer of Test Data: Practical Experience. ITC 1992: 459-465
[c1]
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R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker: Improving Total IC Design Quality Using Application Mode Testing. ITC 1992: 866-872

Coauthor Index

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