Koji Miyamoto

List of publications from the DBLP Bibliography Server - FAQ
Other views: by type - by year (modern) - classic-C

Ask others: ACM DL/Guide -

	2002
j1		Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li: Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability 42(9-11): 1433-1438 (2002)
	2000
c1		Shaoying Liu, Tetsuo Fukuzaki, Koji Miyamoto: A GUI and testing tool for SOFL. APSEC 2000: 421-

Coauthor Index

Last update Wed May 22 00:22:07 2013 CET by the DBLP Team —

Data released under the ODC-BY 1.0 license — See also our legal information page