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Brian Leslie

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1980 – 1989

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1989
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Brian Leslie, Farid Matta:
Wafer-level testing with a membrane probe. IEEE Des. Test 6(1): 10-17 (1989)
1988
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Brian Leslie, Farid Matta:
Membrane Probe Card Technology (the Future for High Performance Wafer Test). ITC 1988: 601-607

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