D. Lachenal

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	2007
j2		D. Lachenal, A. Bravaix, F. Monsieur, Yannick Rey-Tauriac: Degradation mechanism understanding of NLDEMOS SOI in RF applications. Microelectronics Reliability 47(9-11): 1634-1638 (2007)
	2005
j1		Yannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix: Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectronics Reliability 45(9-11): 1349-1354 (2005)

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