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Young Hoon Kwark
2010 – today
- 2012
[j3]Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster: Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures. IEEE T. Instrumentation and Measurement 61(12): 3198-3206 (2012)
2000 – 2009
- 2008
- [c1]Renato Rimolo-Donadio, Christian Schuster, Xiaoxiong Gu, Young Hoon Kwark, Mark B. Ritter: Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects. DATE 2008: 252-255
- 2005
- [j2]John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang: Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM Journal of Research and Development 49(4-5): 725-754 (2005)
- 2003
- [j1]Daniel J. Friedman, Mounir Meghelli, Benjamin D. Parker, Jungwook Yang, Herschel A. Ainspan, Alexander Rylyakov, Young Hoon Kwark, Mark B. Ritter, Lei Shan, Steven J. Zier, Michael Sorna, Mehmet Soyuer: SiGe BiCMOS integrated circuits for high-speed serial communication links. IBM Journal of Research and Development 47(2-3): 259-282 (2003)
Coauthor Index
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last updated on 2012-11-21 01:09 CET by the dblp team