Jaydeep Kulkarni

Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky: Design for test and reliability in ultimate CMOS. DATE 2012: 677-682

Jaydeep Kulkarni, Bibiche M. Geuskens, Tanay Karnik, Muhammad M. Khellah, James Tschanz, Vivek De: Capacitive-coupling wordline boosting with self-induced VCC collapse for write VMIN reduction in 22-nm 8T SRAM. ISSCC 2012: 234-236

James Tschanz, Keith A. Bowman, Muhammad M. Khellah, Chris Wilkerson, Bibiche M. Geuskens, Dinesh Somasekhar, Arijit Raychowdhury, Jaydeep Kulkarni, Carlos Tokunaga, Shih-Lien Lu, Tanay Karnik, Vivek De: Resilient design in scaled CMOS for energy efficiency. ASP-DAC 2010: 625

Bibiche M. Geuskens, Muhammad M. Khellah, Jaydeep Kulkarni, Tanay Karnik, Vivek De: Opportunities for PMOS read and write ports in low voltage dual-port 8T bit cell arrays. CICC 2010: 1-4

Arijit Raychowdhury, Bibiche M. Geuskens, Jaydeep Kulkarni, James Tschanz, Keith A. Bowman, Tanay Karnik, Shih-Lien Lu, Vivek De, Muhammad M. Khellah: PVT-and-aging adaptive wordline boosting for 8T SRAM power reduction. ISSCC 2010: 352-353