Shin'ichiro Kimura

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	2002
j1		Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura: Reliability issues of silicon LSIs facing 100-nm technology node. Microelectronics Reliability 42(4-5): 493-506 (2002)

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