| 2010 | ||
|---|---|---|
| j3 | Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud: Crosstalk-Induced Delay, Noise, and Interconnect Planarization Implications of Fill Metal in Nanoscale Process Technology. IEEE Trans. VLSI Syst. 18(3): 378-391 (2010) | |
| c16 | Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger: Who solves the variability problem? DAC 2010: 218-219 | |
| 2008 | ||
| c15 | Yongqiang Lu, Qing Su, Jamil Kawa: An innovative Steiner tree based approach for polygon partitioning. ASP-DAC 2008: 358-363 | |
| c14 | Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud: Automated design of tunable impedance matching networks for reconfigurable wireless applications. DAC 2008: 498-503 | |
| c13 | Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud: Impact of dummy filling techniques on interconnect capacitance and planarization in nano-scale process technology. ACM Great Lakes Symposium on VLSI 2008: 151-154 | |
| c12 | Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud: Robust reconfigurable filter design using analytic variability quantification techniques. ICCAD 2008: 765-770 | |
| c11 | Qing Su, Charles Chiang, Jamil Kawa: Hotspot Based Yield Prediction with Consideration of Correlations. ISQED 2008: 338-343 | |
| c10 | Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud: Investigating the Impact of Fill Metal on Crosstalk-Induced Delay and Noise. ISQED 2008: 724-729 | |
| 2007 | ||
| c9 | Jamil Kawa, Charles Chiang: DFM issues for 65nm and beyond. ACM Great Lakes Symposium on VLSI 2007: 318-322 | |
| 2006 | ||
| j2 | Qing Su, Jamil Kawa, Charles Chiang, Yehia Massoud: Accurate modeling of substrate resistive coupling for floating substrates. ACM Trans. Design Autom. Electr. Syst. 11(1): 44-51 (2006) | |
| c8 | Charles Chiang, Jamil Kawa: Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation. APCCAS 2006: 1099-1102 | |
| c7 | Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles Chiang: An IC manufacturing yield model considering intra-die variations. DAC 2006: 749-754 | |
| c6 | Dan Page, Jamil Kawa, Charles Chiang: DFM: swimming upstream. ACM Great Lakes Symposium on VLSI 2006: 1 | |
| 2005 | ||
| c5 | Jianfeng Luo, Qing Su, Charles Chiang, Jamil Kawa: A layout dependent full-chip copper electroplating topography model. ICCAD 2005: 133-140 | |
| c4 | Xin Wang, Charles Chiang, Jamil Kawa, Qing Su: A Min-Variance Iterative Method for Fast Smart Dummy Feature Density Assignment in Chemical-Mechanical Polishing. ISQED 2005: 258-263 | |
| 2004 | ||
| c3 | Narendra V. Shenoy, Jamil Kawa, Raul Camposano: Design automation for mask programmable fabrics. DAC 2004: 192-197 | |
| c2 | Bo-Kyung Choi, Charles Chiang, Jamil Kawa, Majid Sarrafzadeh: Routing resources consumption on M-arch and X-arch. ISCAS (5) 2004: 73-76 | |
| 2002 | ||
| j1 | Yehia Massoud, Steve S. Majors, Jamil Kawa, Tareq Bustami, Don MacMillen, Jacob K. White: Managing on-chip inductive effects. IEEE Trans. VLSI Syst. 10(6): 789-798 (2002) | |
| 2001 | ||
| c1 | Yehia Massoud, Jamil Kawa, Don MacMillen, Jacob White: Modeling and Analysis of Differential Signaling for Minimizing Inductive Cross-Talk. DAC 2001: 804-809 | |
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