Markus Karner

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	2010
j3		Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser: Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectronics Reliability 50(9-11): 1267-1272 (2010)
	2007
j2		Stefan Holzer, Alireza Sheikholeslami, Markus Karner, Tibor Grasser, Siegfried Selberherr: Comparison of deposition models for a TEOS LPCVD process. Microelectronics Reliability 47(4-5): 623-625 (2007)
j1		Markus Karner, Andreas Gehring, M. Wagner, R. Entner, Stefan Holzer, Wolfgang Gös, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr: VSP - A gate stack analyzer. Microelectronics Reliability 47(4-5): 704-708 (2007)
	2005
c1		Markus Karner, Andreas Gehring, Stefan Holzer, Hans Kosina: Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling. LSSC 2005: 572-577

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