Le Jin

Jingbo Duan, Le Jin, Degang Chen: Testing ADC Spectral Performance Without Dedicated Data Acquisition. IEEE T. Instrumentation and Measurement 61(11): 2941-2952 (2012)

Le Jin: Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters. J. Electronic Testing 27(2): 163-175 (2011)

Le Jin, Lin Liang: A power-of-two FFT algorithm and structure for DRM receiver. IEEE Trans. Consumer Electronics 56(4): 2061-2066 (2010)

Jingbo Duan, Le Jin, Degang Chen: INL based dynamic performance estimation for ADC BIST. ISCAS 2010: 3028-3031

Jingbo Duan, Le Jin, Degang Chen: A new method for estimating spectral performance of ADC from INL. ITC 2010: 694-703

Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE T. Instrumentation and Measurement 58(8): 2679-2685 (2009)

Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin: Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74

Jin Yu, Limin Zhi, Yunming Qiu, Le Jin, Hailu Du: Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network. CSO (1) 2009: 663-665

Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin: Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. European Test Symposium 2009: 3-8

Liang Chen, Le Jin, Feng He, Hanwen Cheng, Lenan Wu: Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks. IEICE Transactions 91-B(10): 3069-3076 (2008)

Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen: Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE T. Instrumentation and Measurement 57(5): 940-946 (2008)

Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin: System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405

Le Jin: Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation. ITC 2008: 1-8

Le Jin, Degang Chen, Randall L. Geiger: SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE T. Instrumentation and Measurement 56(5): 1776-1785 (2007)

Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310

Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger: A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006

Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger: Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006

Le Jin, Degang Chen, Randall L. Geiger: Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9

Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen: Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE T. Instrumentation and Measurement 54(3): 1188-1199 (2005)

Le Jin, Degang Chen, Randall L. Geiger: A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381

Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen: A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen: High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10

Chengming He, Le Jin, Degang Chen, Randall L. Geiger: Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484

Le Jin, Chengming He, Degang Chen, Randall L. Geiger: An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931

Le Jin, Chengming He, Degang Chen, Randall L. Geiger: Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935

Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger: BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003)

Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger: Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227