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C. Y. Huang
2010 – today
- 2011
[j4]M. Y. Tsai, C. W. Ting, C. Y. Huang, Yi-Shao Lai: Determination of residual strains of the EMC in PBGA during manufacturing and IR solder reflow processes. Microelectronics Reliability 51(3): 642-648 (2011)
2000 – 2009
- 2007
- [j3]Wen Lea Pearn, H. N. Hung, N. F. Peng, C. Y. Huang: Testing process precision for truncated normal distributions. Microelectronics Reliability 47(12): 2275-2281 (2007)
- [c2]A. H. I. Lee, S. H. Chung, C. Y. Huang: Minimizing the Total Completion Time for the TFT-Array Factory Scheduling Problem (TAFSP). ICCSA (1) 2007: 767-778
- 2005
- [c1]C. Sumodhee, J. L. Hsieh, C. T. Sun, C. Y. Huang, Arthur Y. M. Chen: Impact of Social Behaviors on HIV Epidemic: A Computer Simulation View. CIMCA/IAWTIC 2005: 550-556
- 2003
- [j2]J. D. Wu, C. Y. Huang, C. C. Liao: Fracture strength characterization and failure analysis of silicon dies. Microelectronics Reliability 43(2): 269-277 (2003)
- 2002
- [j1]J. D. Wu, S. H. Ho, C. Y. Huang, C. C. Liao, P. J. Zheng, S. C. Hung: Board level reliability of a stacked CSP subjected to cyclic bending. Microelectronics Reliability 42(3): 407-416 (2002)
Coauthor Index
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last updated on 2012-09-10 15:49 CEST by the dblp team