John P. Hayes

Smita Krishnaswamy, Igor L. Markov, John P. Hayes: Design, Analysis and Test of Logic Circuits Under Uncertainty. Lecture Notes in Electrical Engineering 115, Springer 2013, isbn 978-90-481-9643-2, pp. 1-120

Joonhwan Yi, John P. Hayes: Robust Coupling Delay Test Sets. J. Electronic Testing 28(3): 375-388 (2012)

Kenneth M. Zick, John P. Hayes: Low-cost sensing with ring oscillator arrays for healthier reconfigurable systems. TRETS 5(1): 1 (2012)

Alexandru Paler, Ilia Polian, John P. Hayes: Detection and diagnosis of faulty quantum circuits. ASP-DAC 2012: 181-186

Chien-Chih Yu, Armin Alaghi, John P. Hayes: Scalable sampling methodology for logic simulation: Reduced-Ordered Monte Carlo. ICCAD 2012: 195-201

Armin Alaghi, John P. Hayes: A spectral transform approach to stochastic circuits. ICCD 2012: 315-321

Ilia Polian, John P. Hayes: Selective Hardening: Toward Cost-Effective Error Tolerance. IEEE Design & Test of Computers 28(3): 54-63 (2011)

Ilia Polian, John P. Hayes, Sudhakar M. Reddy, Bernd Becker: Modeling and Mitigating Transient Errors in Logic Circuits. IEEE Trans. Dependable Sec. Comput. 8(4): 537-547 (2011)

Chien-Chih Yu, John P. Hayes: Trigonometric method to handle realistic error probabilities in logic circuits. DATE 2011: 64-69

Dae Young Lee, David D. Wentzloff, John P. Hayes: Wireless wafer-level testing of integrated circuits via capacitively-coupled channels. DDECS 2011: 99-104

Alexandru Paler, Armin Alaghi, Ilia Polian, John P. Hayes: Tomographic Testing and Validation of Probabilistic Circuits. European Test Symposium 2011: 63-68

Ilia Polian, John P. Hayes: Advanced modeling of faults in Reversible circuits. EWDTS 2010: 376-381

Kenneth M. Zick, John P. Hayes: On-line sensing for healthier FPGA systems. FPGA 2010: 239-248

Kenneth M. Zick, John P. Hayes: Self-Test and Adaptation for Random Variations in Reliability. FPL 2010: 193-198

Kenneth M. Zick, John P. Hayes: Toward Physically-Adaptive Computing. SASO 2010: 124-133

Chien-Chih Yu, John P. Hayes: Scalable and accurate estimation of probabilistic behavior in sequential circuits. VTS 2010: 165-170

George F. Viamontes, Igor L. Markov, John P. Hayes: Quantum Circuit Simulation. Springer 2009, isbn 978-90-481-3064-1, pp. I-X, 1-190

Smita Krishnaswamy, Stephen Plaza, Igor L. Markov, John P. Hayes: Signature-Based SER Analysis and Design of Logic Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 28(1): 74-86 (2009)

Smita Krishnaswamy, Igor L. Markov, John P. Hayes: Improving testability and soft-error resilience through retiming. DAC 2009: 508-513

Erik Jan Marinissen, Dae Young Lee, John P. Hayes, Chris Sellathamby, Brian Moore, Steven Slupsky, Laurence Pujol: Contactless testing: Possibility or pipe-dream? DATE 2009: 676-681

Kenneth M. Zick, John P. Hayes: On-line characterization and reconfiguration for single event upset variations. IOLTS 2009: 243-248

Ketan N. Patel, Igor L. Markov, John P. Hayes: Optimal synthesis of linear reversible circuits. Quantum Information & Computation 8(3): 282-294 (2008)

Smita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes: Probabilistic transfer matrices in symbolic reliability analysis of logic circuits. ACM Trans. Design Autom. Electr. Syst. 13(1) (2008)

Smita Krishnaswamy, Igor L. Markov, John P. Hayes: On the role of timing masking in reliable logic circuit design. DAC 2008: 924-929

Kenneth M. Zick, John P. Hayes: High-level vulnerability over space and time to insidious soft errors. HLDVT 2008: 161-168

Sungsoon Cho, John P. Hayes: Optimizing router locations for minimum-energy wireless networks. LCN 2008: 544-546

Smita Krishnaswamy, Igor L. Markov, John P. Hayes: Tracking Uncertainty with Probabilistic Logic Circuit Testing. IEEE Design & Test of Computers 24(4): 312-321 (2007)

George F. Viamontes, Igor L. Markov, John P. Hayes: Checking equivalence of quantum circuits and states. ICCAD 2007: 69-74

Smita Krishnaswamy, Stephen Plaza, Igor L. Markov, John P. Hayes: Enhancing design robustness with reliability-aware resynthesis and logic simulation. ICCAD 2007: 149-154

Sungsoon Cho, John P. Hayes: Power-Aware Link Maintenance (PALM) for Mobile Ad Hoc Networks. LCN 2007: 403-410

John P. Hayes, Ilia Polian, Bernd Becker: An Analysis Framework for Transient-Error Tolerance. VTS 2007: 249-255

Aditya K. Prasad, Vivek V. Shende, Igor L. Markov, John P. Hayes, Ketan N. Patel: Data structures and algorithms for simplifying reversible circuits. JETC 2(4): 277-293 (2006)

Feng Gao, John P. Hayes: Gate Sizing and Vt Assignment for Active-Mode Leakage Power Reduction. J. Low Power Electronics 2(2): 230-239 (2006)

Joonhwan Yi, John P. Hayes: High-level delay test generation for modular circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(3): 576-590 (2006)

Feng Gao, John P. Hayes: Exact and Heuristic Approaches to Input Vector Control for Leakage Power Reduction. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2564-2571 (2006)

Ramashis Das, Igor L. Markov, John P. Hayes: On-Chip Test Generation Using Linear Subspaces. European Test Symposium 2006: 111-116

Joonhwan Yi, John P. Hayes: The Coupling Model for Function and Delay Faults. J. Electronic Testing 21(6): 631-649 (2005)

George F. Viamontes, Igor L. Markov, John P. Hayes: Graph-based simulation of quantum computation in the density matrix representation. Quantum Information & Computation 5(2): 113-130 (2005)

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray: Dependable communication synthesis for distributed embedded systems. Rel. Eng. & Sys. Safety 89(1): 81-92 (2005)

Amit Chowdhary, John P. Hayes: Area-optimal technology mapping for field-programmable gate arrays based on lookup tables. IEEE Trans. on CAD of Integrated Circuits and Systems 24(7): 999-1013 (2005)

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray: Time-Constrained Failure Diagnosis in Distributed Embedded Systems: Application to Actuator Diagnosis. IEEE Trans. Parallel Distrib. Syst. 16(3): 258-270 (2005)

John P. Hayes: Faults and Tests in Quantum Circuits. Asian Test Symposium 2005

Ilia Polian, Thomas Fiehn, Bernd Becker, John P. Hayes: A Family of Logical Fault Models for Reversible Circuits. Asian Test Symposium 2005: 422-427

Nagarajan Kandasamy, Sherif Abdelwahed, Gregory C. Sharp, John P. Hayes: An Online Control Framework for Designing Self-Optimizing Computing Systems: Application to Power Management. Self-star Properties in Complex Information Systems 2005: 174-188

Feng Gao, John P. Hayes: Total power reduction in CMOS circuits via gate sizing and multiple threshold voltages. DAC 2005: 31-36

Smita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes: Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices. DATE 2005: 282-287

Ilia Polian, John P. Hayes, Sandip Kundu, Bernd Becker: Transient fault characterization in dynamic noisy environments. ITC 2005: 10

Sungsoon Cho, John P. Hayes: Impact of mobility on connection in ad hoc networks. WCNC 2005: 1650-1656

Ketan N. Patel, John P. Hayes, Igor L. Markov: Fault testing for reversible circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 23(8): 1220-1230 (2004)

John P. Hayes, Ilia Polian, Bernd Becker: Testing for Missing-Gate Faults in Reversible Circuits. Asian Test Symposium 2004: 100-105

George F. Viamontes, Igor L. Markov, John P. Hayes: High-Performance QuIDD-Based Simulation of Quantum Circuits. DATE 2004: 1354-1355

Rajesh Venkatasubramanian, John P. Hayes: Discovering 1-FT Routes in Mobile Ad Hoc Networks. DSN 2004: 627-636

Nagarajan Kandasamy, Sherif Abdelwahed, John P. Hayes: Self-Optimization in Computer Systems via On-Line Control: Application to Power Management. ICAC 2004: 54-61

Feng Gao, John P. Hayes: Exact and heuristic approaches to input vector control for leakage power reduction. ICCAD 2004: 527-532

Feng Gao, John P. Hayes: Gate Sizing and V{t} Assignment for Active-Mode Leakage Power Reduction. ICCD 2004: 258-264

Feng Gao, John P. Hayes: On-Line Monitor Design of Finite-State Machines. J. Electronic Testing 19(5): 537-548 (2003)

Vivek V. Shende, Aditya K. Prasad, Igor L. Markov, John P. Hayes: Synthesis of reversible logic circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 22(6): 710-722 (2003)

Ronald D. Blanton, John P. Hayes: On the properties of the input pattern fault model. ACM Trans. Design Autom. Electr. Syst. 8(1): 108-124 (2003)

George F. Viamontes, Manoj Rajagopalan, Igor L. Markov, John P. Hayes: Gate-level simulation of quantum circuits. ASP-DAC 2003: 295-301

John P. Hayes: Tutorial: basic concepts in quantum circuits. DAC 2003: 893

Rajesh Venkatasubramanian, John P. Hayes, Brian T. Murray: Low-Cost On-Line Fault Detection Using Control Flow Assertions. IOLTS 2003: 137-143

Feng Gao, John P. Hayes: ILP-based optimization of sequential circuits for low power. ISLPED 2003: 140-145

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray: Dependable Communication Synthesis for Distributed Embedded Systems. SAFECOMP 2003: 275-288

Ketan N. Patel, John P. Hayes, Igor L. Markov: Fault Testing for Reversible Circuits. VTS 2003: 410-416

Dimitris Nikolos, John P. Hayes, Michael Nicolaidis, Cecilia Metra: Guest Editorial. J. Electronic Testing 18(3): 259-260 (2002)

Amit Chowdhary, John P. Hayes: General technology mapping for field-programmable gate arrays based on lookup tables. ACM Trans. Design Autom. Electr. Syst. 7(1): 1-32 (2002)

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray: Time-Constrained Failure Diagnosis in Distributed Embedded Systems. DSN 2002: 449-458

Vivek V. Shende, Aditya K. Prasad, Igor L. Markov, John P. Hayes: Reversible logic circuit synthesis. ICCAD 2002: 353-360

Feng Gao, John P. Hayes: On-Line Monitor Design of Finite-State Machines. IOLTW 2002: 74-78

John P. Hayes: Fault-Tolerant Quantum Computers. IPDPS 2002

Vivek V. Shende, Aditya K. Prasad, Igor L. Markov, John P. Hayes: Reversible Logic Circuit Synthesis. IWLS 2002: 125-130

Hyungwon Kim, John P. Hayes: Realization-independent ATPG for designs with unimplemented blocks. IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 290-306 (2001)

Hakan Yalcin, Mohammad Mortazavi, Robert Palermo, Cyrus Bamji, Karem A. Sakallah, John P. Hayes: Fast and accurate timing characterization using functionalinformation. IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 315-331 (2001)

Hyungwon Kim, John P. Hayes: Delay fault testing of IP-based designs via symbolic path modeling. IEEE Trans. VLSI Syst. 9(5): 661-678 (2001)

Hakan Yalcin, Robert Palermo, Mohammad Mortazavi, Cyrus Bamji, Karem A. Sakallah, John P. Hayes: An Advanced Timing Characterization Method Using Mode Dependency. DAC 2001: 657-660

David Van Campenhout, Trevor N. Mudge, John P. Hayes: Collection and Analysis of Microprocessor Design Errors. IEEE Design & Test of Computers 17(4): 51-60 (2000)

Hussain Al-Asaad, John P. Hayes: Logic Design Validation via Simulation and Automatic Test Pattern Generation. J. Electronic Testing 16(6): 575-589 (2000)

Avaneendra Gupta, John P. Hayes: CLIP: integer-programming-based optimal layout synthesis of 2D CMOS cells. ACM Trans. Design Autom. Electr. Syst. 5(3): 510-547 (2000)

Ronald D. Blanton, John P. Hayes: On the design of fast, easily testable ALU's. IEEE Trans. VLSI Syst. 8(2): 220-223 (2000)

Hussain Al-Asaad, John P. Hayes: ESIM: A Multimodel Design Error and Fault Simulator for Logic Circuits. VTS 2000: 221-230

Mark C. Hansen, Hakan Yalcin, John P. Hayes: Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering. IEEE Design & Test of Computers 16(3): 72-80 (1999)

David Van Campenhout, Trevor N. Mudge, John P. Hayes: High-Level Test Generation for Design Verification of Pipelined Microprocessors. DAC 1999: 185-188

Hyungwon Kim, John P. Hayes: Delay fault testing of IP-based designs via symbolic path modeling. ITC 1999: 1045-1054

Nagarajan Kandasamy, John P. Hayes, Brian T. Murray: Tolerating Transient Faults in Statically Scheduled Safety-Critical Embedded Systems. SRDS 1999: 212-221

Avaneendra Gupta, John P. Hayes: Near-Optimum Hierarchical Layout Synthesis of Two-Dimensional CMOS Cells. VLSI Design 1999: 453-459

Hyungwon Kim, John P. Hayes: Delay Fault Testing of Designs with Embedded IP Cores. VTS 1999: 160-167

Hussain Al-Asaad, Brian T. Murray, John P. Hayes: Online BIST for Embedded Systems. IEEE Design & Test of Computers 15(4): 17-24 (1998)

Hussain Al-Asaad, John P. Hayes, Brian T. Murray: Scalable Test Generators for High-Speed Datapath Circuits. J. Electronic Testing 12(1-2): 111-125 (1998)

Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes: Optimal Zero-Aliasing Space Compaction of Test Responses. IEEE Trans. Computers 47(11): 1171-1187 (1998)

David Van Campenhout, Hussain Al-Asaad, John P. Hayes, Trevor N. Mudge, Richard B. Brown: High-level design verification of microprocessors via error modeling. ACM Trans. Design Autom. Electr. Syst. 3(4): 581-599 (1998)

Krishnendu Chakrabarty, John P. Hayes: Zero-aliasing space compaction of test responses using multiple parity signatures. IEEE Trans. VLSI Syst. 6(2): 309-313 (1998)

Avaneendra Gupta, John P. Hayes: Optimal 2-D cell layout with integrated transistor folding. ICCAD 1998: 128-135

Hyungwon Kim, John P. Hayes: High-coverage ATPG for datapath circuits with unimplemented blocks. ITC 1998: 577-586

R. D. (Shawn) Blanton, John P. Hayes: Testability Properties of Divergent Trees. J. Electronic Testing 11(3): 197-209 (1997)

Hung-Kuei Ku, John P. Hayes: Systematic Design of Fault-Tolerant Multiprocessors with Shared Buses. IEEE Trans. Computers 46(4): 439-455 (1997)

Krishnendu Chakrabarty, John P. Hayes: On the quality of accumulator-based compaction of test responses. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 916-922 (1997)

Hakan Yalcin, John P. Hayes: Event propagation conditions in circuit delay computation. ACM Trans. Design Autom. Electr. Syst. 2(3): 249-280 (1997)

Hung-Kuei Ku, John P. Hayes: Connective Fault Tolerance in Multiple-Bus Systems. IEEE Trans. Parallel Distrib. Syst. 8(6): 574-586 (1997)

Avaneendra Gupta, John P. Hayes: CLIP: An Optimizing Layout Generator for Two-Dimensional CMOS Cells. DAC 1997: 452-455

Ronald D. Blanton, John P. Hayes: The input pattern fault model and its application. ED&TC 1997: 628

Amit Chowdhary, John P. Hayes: General Modeling and Technology-Mapping Technique for LUT-Based FPGAs. FPGA 1997: 43-49

Ronald D. Blanton, John P. Hayes: Properties of the Input Pattern Fault Model. ICCD 1997: 372-380

Avaneendra Gupta, John P. Hayes: A Hierarchical Technique for Minimum-Width Layout of Two-Dimensional CMOS Cells. VLSI Design 1997: 15-20

Brian T. Murray, John P. Hayes: Testing ICs: Getting to the Core of the Problem. IEEE Computer 29(11): 32-38 (1996)

Krishnendu Chakrabarty, John P. Hayes: Balance testing and balance-testable design of logic circuits. J. Electronic Testing 8(1): 71-86 (1996)

Frank Harary, John P. Hayes: Node fault tolerance in graphs. Networks 27(1): 19-23 (1996)

Hung-Kuei Ku, John P. Hayes: Optimally edge fault-tolerant trees. Networks 27(3): 203-214 (1996)

Ronald D. Blanton, John P. Hayes: Testability of Convergent Tree Circuits. IEEE Trans. Computers 45(8): 950-963 (1996)

Krishnendu Chakrabarty, John P. Hayes: Test response compaction using multiplexed parity trees. IEEE Trans. on CAD of Integrated Circuits and Systems 15(11): 1399-1408 (1996)

Hakan Yalcin, John P. Hayes, Karem A. Sakallah: An approximate timing analysis method for datapath circuits. ICCAD 1996: 114-118

Avaneendra Gupta, John P. Hayes: Width minimization of two-dimensional CMOS cells using integer programming. ICCAD 1996: 660-667

R. D. (Shawn) Blanton, John P. Hayes: Design of a fast, easily testable ALU. VTS 1996: 9-16

Krishnendu Chakrabarty, John P. Hayes: Cumulative balance testing of logic circuits. IEEE Trans. VLSI Syst. 3(1): 72-83 (1995)

Hussain Al-Asaad, John P. Hayes: Design verification via simulation and automatic test pattern generation. ICCAD 1995: 174-180

Amit Chowdhary, John P. Hayes: Technology mapping for field-programmable gate arrays using integer programming. ICCAD 1995: 346-352

Hakan Yalcin, John P. Hayes: Hierarchical timing analysis using conditional delays. ICCAD 1995: 371-377

Mark C. Hansen, John P. Hayes: High-Level Test Generation Using Symbolic Scheduling. ITC 1995: 586-595

Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes: Optimal Space Compaction of Test Responses. ITC 1995: 834-843

Mark C. Hansen, John P. Hayes: High-level test generation using physically-induced faults. VTS 1995: 20-28

Krishnendu Chakrabarty, John P. Hayes: DFBT: A Design-for-Testability Method Based on Balance Testing. DAC 1994: 351-357

Hung-Kuei Ku, John P. Hayes: Connectivity and Fault Tolerance of Multiple-Bus Systems. FTCS 1994: 372-381

Krishnendu Chakrabarty, John P. Hayes: Efficient Test-Response Compression for Multiple-Output Cicuits. ITC 1994: 501-510

Pinaki Mazumder, John P. Hayes: Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories. IEEE Design & Test of Computers 10(1): 6-7 (1993)

Frank Harary, John P. Hayes: Edge fault tolerance in graphs. Networks 23(2): 135-142 (1993)

Ram Raghavan, John P. Hayes: Reducing Inerference Among Vector Accesses in Interleaved Memories. IEEE Trans. Computers 42(4): 471-483 (1993)

Ronald D. Blanton, John P. Hayes: Efficient Testing of Tree Circuits. FTCS 1993: 176-185

Krishnendu Chakrabarty, John P. Hayes: Balance Testing of Logic Circuits. FTCS 1993: 350-359

Tze Chiang Lee, John P. Hayes: Design of Gracefully Degradable Hypercube-Connected Systems. J. Parallel Distrib. Comput. 14(4): 390-401 (1992)

Shantanu Dutt, John P. Hayes: Some Practical Issues in the Design of Fault-Tolerant Multiprocessors. IEEE Trans. Computers 41(5): 588-598 (1992)

Tze Chiang Lee, John P. Hayes: A Fault-Tolerant Communication Scheme for Hypercube Computers. IEEE Trans. Computers 41(10): 1242-1256 (1992)

Eduard Cerny, John P. Hayes, Nicholas C. Rumin: Accuracy of magnitude-class calculations in switch-level modeling. IEEE Trans. on CAD of Integrated Circuits and Systems 11(4): 443-452 (1992)

Michael J. Batek, John P. Hayes: Test-Set Preserving Logic Transformations. DAC 1992: 454-458

Shantanu Dutt, John P. Hayes: Designing Fault-Tolerant System Using Automorphisms. J. Parallel Distrib. Comput. 12(3): 249-268 (1991)

Shantanu Dutt, John P. Hayes: Subcube Allocation in Hypercube Computers. IEEE Trans. Computers 40(3): 341-352 (1991)

Robert L. Maziasz, John P. Hayes: Exact Width and Height Minimization of CMOS Cells. DAC 1991: 487-493

Shantanu Dutt, John P. Hayes: Some Practical Issues in the Design of Fault-Tolerant Multiprocessors. FTCS 1991: 292-299

Ram Raghavan, John P. Hayes: Scalar-Vector Memory Interference in Vector Computers. ICPP (1) 1991: 180-187

Brian T. Murray, John P. Hayes: Test Propagation Through Modules and Circuits. ITC 1991: 748-757

Debashis Bhattacharya, John P. Hayes: A hierarchical test generation methodology for digital circuits. J. Electronic Testing 1(2): 103-123 (1990)

Shantanu Dutt, John P. Hayes: On Designing and Reconfiguring k-Fault-Tolerant Tree Architectures. IEEE Trans. Computers 39(4): 490-503 (1990)

Brian T. Murray, John P. Hayes: Hierarchical test generation using precomputed tests for modules. IEEE Trans. on CAD of Integrated Circuits and Systems 9(6): 594-603 (1990)

Robert L. Maziasz, John P. Hayes: Layout optimization of static CMOS functional cells. IEEE Trans. on CAD of Integrated Circuits and Systems 9(7): 708-719 (1990)

Debashis Bhattacharya, John P. Hayes: Designing for high-level test generation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(7): 752-766 (1990)

Ram Raghavan, John P. Hayes: On randomly interleaved memories. SC 1990: 49-58

Debashis Bhattacharya, Brian T. Murray, John P. Hayes: High-Level Test Generation for VLSI. IEEE Computer 22(4): 16-24 (1989)

Shantanu Dutt, John P. Hayes: An automorphic approach to the design of fault-tolerant multiprocessors. FTCS 1989: 496-503

Raif M. Yanney, John P. Hayes: Fault Recovery in Distributed Processing Loop Networks. Computer Networks 15: 229-243 (1988)

Musaravakkam S. Krishnan, John P. Hayes: A normalized-area measure for VLSI layouts. IEEE Trans. on CAD of Integrated Circuits and Systems 7(3): 411-419 (1988)

Y. You, John P. Hayes: Implementation of VLSI self-testing by regularization. IEEE Trans. on CAD of Integrated Circuits and Systems 7(12): 1261-1271 (1988)

Shantanu Dutt, John P. Hayes: Design and reconfiguration strategies for near-optimal k-fault-tolerant tree architectures. FTCS 1988: 328-333

Brian T. Murray, John P. Hayes: Hierarchical Test Generation Using Precomputed Tests for Modules. ITC 1988: 221-229

R. L. Maiasz, John P. Hayes: Layout Optimization of CMOS Functional Cells. DAC 1987: 544-551

Trevor N. Mudge, John P. Hayes, Gregory D. Buzzard, Donald C. Winsor: Analysis of Multiple-Bus Interconnection Networks. J. Parallel Distrib. Comput. 3(3): 328-343 (1986)

John Paul Shen, John P. Hayes, Luigi Ciminiera, Angelo Serra: Fault-tolerance and performance analysis of beta-networks. Parallel Computing 3(3): 231-249 (1986)

John P. Hayes: Uncertainty, Energy, and Multiple-Valued Logics. IEEE Trans. Computers 35(2): 107-114 (1986)

John P. Hayes: Pseudo-Boolean Logic Circuits. IEEE Trans. Computers 35(7): 602-612 (1986)

Raif M. Yanney, John P. Hayes: Distributed Recovery in Fault-Tolerant Multiprocessor Networks. IEEE Trans. Computers 35(10): 871-879 (1986)

Musaravakkam S. Krishnan, John P. Hayes: An Array Layout Methodology for VLlSI Circuits. IEEE Trans. Computers 35(12): 1055-1067 (1986)

John P. Hayes: Digital Simulation with Multiple Logic Values. IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 274-283 (1986)

John P. Hayes, Trevor N. Mudge, Quentin F. Stout: Architecture of a Hypercube Supercomputer. ICPP 1986: 653-660

John Paul Shen, John P. Hayes: Fault-Tolerance of Dynamic-Full-Access Interconnection Networks. IEEE Trans. Computers 33(3): 241-248 (1984)

John P. Hayes: Fault Modeling for Digital MOS Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 3(3): 200-208 (1984)

Masato Kawai, John P. Hayes: An experimental MOS fault simulation program CSASIM. DAC 1984: 2-9

Raif M. Yanney, John P. Hayes: Distributed Recovery in Fault-Tolerant Multiprocessor Networks. ICDCS 1984: 514-525

John P. Hayes: A fault simulation methodology for VLSI. DAC 1982: 393-399

Thirumalai Sridhar, John P. Hayes: A Functional Approach to Testing Bit-Sliced Microprocessors. IEEE Trans. Computers 30(8): 563-571 (1981)

Thirumalai Sridhar, John P. Hayes: Design of Easily Testable Bit-Sliced Systems. IEEE Trans. Computers 30(11): 842-854 (1981)

Ayee Goundan, John P. Hayes: Design of Totally Fault Locatable Combinational Networks. IEEE Trans. Computers 29(1): 33-44 (1980)

John P. Hayes: Testing Memories for Single-Cell Pattern-Sensitive Faults. IEEE Trans. Computers 29(3): 249-254 (1980)

Ayee Goundan, John P. Hayes: Identification of Equivalent Faults in Logic Networks. IEEE Trans. Computers 29(11): 978-985 (1980)

John Paul Shen, John P. Hayes: Fault Tolerance of a Class of Connecting Networks. ISCA 1980: 61-71

John P. Hayes: Generation of Optimal Transition Count Tests. IEEE Trans. Computers 27(1): 36-41 (1978)

John P. Hayes: Path Complexity of Logic Networks. IEEE Trans. Computers 27(5): 459-462 (1978)

John P. Hayes: Enumeration of Fanout-Free Boolean Functions. J. ACM 23(4): 700-709 (1976)

John P. Hayes: Transition Count Testing of Combinational Logic Circuits. IEEE Trans. Computers 25(6): 613-620 (1976)

John P. Hayes: A Graph Model for Fault-Tolerant Computing Systems. IEEE Trans. Computers 25(9): 875-884 (1976)

John P. Hayes: On the Properties of Irredundant Logic Networks. IEEE Trans. Computers 25(9): 884-892 (1976)

Ayee Goundan, John P. Hayes: Partitioning logic circuits to maximize fault resolution. DAC 1976: 271-277

John P. Hayes: The Fanout Structure of Switching Functions. J. ACM 22(4): 551-571 (1975)

John P. Hayes: Detection of Pattern-Sensitive Faults in Random-Access Memories. IEEE Trans. Computers 24(2): 150-157 (1975)

John P. Hayes: Minimization of Fanout in Switching Networks. SWAT (FOCS) 1974: 133-139