Harald Gossner

Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton: Electronic design automation (EDA) solutions for ESD-robust design and verification. CICC 2012: 1-8

Harald Gossner, Werner Simbürger, Matthias Stecher: System ESD robustness by co-design of on-chip and on-board protection measures. Microelectronics Reliability 50(9-11): 1359-1366 (2010)

Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner: Do ESD fails in systems correlate with IC ESD robustness? Microelectronics Reliability 49(9-11): 1079-1085 (2009)

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix: Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability 49(12): 1407-1416 (2009)

Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, Jung-Hoon Chun, Choshu Ito, Robert W. Dutton: RF ESD protection strategies: Codesign vs. low-C protection. Microelectronics Reliability 47(7): 1008-1015 (2007)

Martin Streibl, F. Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel: High abstraction level permutational ESD concept analysis. Microelectronics Reliability 45(2): 313-321 (2005)

Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner: A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. Microelectronics Reliability 45(9-11): 1421-1424 (2005)

Harald Gossner: ESD protection for the deep sub micron regime - a challenge for design methodology. VLSI Design 2004: 809-

Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner: Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability 43(7): 1001-1010 (2003)

Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik: Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability 42(9-11): 1267-1274 (2002)

F. Zängl, Harald Gossner, Kai Esmark, R. Owen, G. Zimmermann: Case study of a technology transfer causing ESD problems. Microelectronics Reliability 42(9-11): 1275-1280 (2002)

Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher: Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectronics Reliability 41(3): 385-393 (2001)

Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner: Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability 41(9-10): 1385-1390 (2001)

Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner: Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase. Microelectronics Reliability 41(11): 1761-1770 (2001)