| 2012 | ||
|---|---|---|
| c3 | Yves Bouvier, Achour Ouslimani, Agnieszka Konczykowska, Jean Godin: A 40 GSamples/s InP-DHBT Track-and-Hold Amplifier with high dynamic range and large bandwidth. CSNDSP 2012: 1-4 | |
| c2 | Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux: Advancements on reliability-aware analog circuit design. ESSCIRC 2012: 46-52 | |
| 2011 | ||
| j7 | G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, C. Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin: Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectronics Reliability 51(9-11): 1730-1735 (2011) | |
| j6 | Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, C. Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin: Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectronics Reliability 51(9-11): 1736-1741 (2011) | |
| 2010 | ||
| j5 | G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, C. Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin: Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectronics Reliability 50(9-11): 1548-1553 (2010) | |
| 2009 | ||
| j4 | Nils Weimann, Vincent Houtsma, Rose Kopf, Yves Baeyens, Joseph Weiner, Alaric Tate, John Frackoviak, Young-Kai Chen, Gregory Raybon, Jean Godin, Muriel Riet, Virginie Nodjiadjim, Agnieszka Konczykowska, Jean-Yves Dupuy, Filipe Jorge, André Scavennec, Gabriel Charlet: InP DHBT circuits: From device physics to 40Gb/s and 100Gb/s transmission system experiments. Bell Labs Technical Journal 14(3): 43-62 (2009) | |
| 2006 | ||
| j3 | Jean Godin, Agnieszka Konczykowska, Muriel Riet, Jacques Moulu, Philippe Berdaguer, Filipe Jorge: InP DHBT Integrated Circuits for Fiber-Optic High-Speed Applications. IEICE Transactions 89-C(7): 883-890 (2006) | |
| 2003 | ||
| j2 | André Scavennec, Jean Godin, René Lefevre: 40 Gbit/s transmission: III-V integrated circuits for opto-electronic interfaces. Annales des Télécommunications 58(9-10): 1485-1503 (2003) | |
| j1 | J. C. Martin, C. Maneux, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin: 1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectronics Reliability 43(9-11): 1725-1730 (2003) | |
| 1999 | ||
| c1 | P. Andre, N. Kauffmann, P. Desrousseaux, Jean Godin, Agnieszka Konczykowska: InP HBT circuits for high speed ETDM systems. ISCAS (2) 1999: 504-507 | |
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