| 2005 | ||
|---|---|---|
| j2 | Hideyuki Noda, Kazunari Inoue, Hans Jürgen Mattausch, Tetsushi Koide, Katsumi Dosaka, Kazutami Arimoto, Kazuyasu Fujishima, Kenji Anami, Tsutomu Yoshihara: Embedded Low-Power Dynamic TCAM Architecture with Transparently Scheduled Refresh. IEICE Transactions 88-C(4): 622-629 (2005) | |
| 1993 | ||
| j1 | Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima: Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Design & Test of Computers 10(2): 6-12 (1993) | |
| 1992 | ||
| c2 | Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikishi, Katsunori Suma, Kazuyasu Fujishima: A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. ITC 1992: 615-622 | |
| 1989 | ||
| c1 | Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Tsukasa Oishi, Kazuyasu Fujishima: A New Array Architecture for Parallel Testing in VLSI Memories. ITC 1989: 322-326 | |
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