Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
Piero Franco
1990 – 1999
- 1996
[c8]Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell: Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700- 1995
- [c7]Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey: An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. ITC 1995: 653-662
- [c6]Siyad C. Ma, Piero Franco, Edward J. McCluskey: An Experimental Chip to Evaluate Test Techniques: Experiment Results. ITC 1995: 663-672
- 1994
- [c5]
- [c4]
- 1992
- [j1]Nirmal R. Saxena, Piero Franco, Edward J. McCluskey: Simple Bounds on Serial Signature Analysis Aliasing for Random Testing. IEEE Trans. Computers 41(5): 638-645 (1992)
- 1991
- [c3]Nirmal R. Saxena, Piero Franco, Edward J. McCluskey: Bounds on Signature Analysis Aliasing for Random Testing. FTCS 1991: 104-113
- [c2]Piero Franco, Edward J. McCluskey: Delay Testing of Digital Circuits by Output Waveform Analysis. ITC 1991: 798-807
- [c1]Nirmal R. Saxena, Piero Franco, Edward J. McCluskey: Refined Bounds on Signature Analysis Aliasing for Random Testing. ITC 1991: 818-827
Coauthor Index
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2012-11-16 01:02 CET by the dblp team