Werner Frammelsberger

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	2007
j4		M. Lanza, M. Porti, M. Nafría, Guenther Benstetter, Werner Frammelsberger, H. Ranzinger, E. Lodermeier, G. Jaschke: Influence of the manufacturing process on the electrical properties of thin (k stacks observed with CAFM. Microelectronics Reliability 47(9-11): 1424-1428 (2007)
	2006
j3		W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter: Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability 46(9-11): 1736-1740 (2006)
	2005
j2		Peter Breitschopf, Guenther Benstetter, Bernhard Knoll, Werner Frammelsberger: Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling. Microelectronics Reliability 45(9-11): 1568-1571 (2005)
	2003
j1		Werner Frammelsberger, Guenther Benstetter, Thomas Schweinboeck, Richard J. Stamp, Janice Kiely: Characterization of thin and ultra-thin SiO₂ films and SiO₂/Si interfaces with combined conducting and topographic atomic force microscopy. Microelectronics Reliability 43(9-11): 1465-1470 (2003)

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