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Hongxia Fang
2010 – today
- 2012
[j5]Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu: Reproduction and Detection of Board-Level Functional Failure. IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 630-643 (2012)- [j4]Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu: Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. IEEE Trans. on CAD of Integrated Circuits and Systems 31(10): 1586-1599 (2012)
- [j3]Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti: Functional Test-Sequence Grading at Register-Transfer Level. IEEE Trans. VLSI Syst. 20(10): 1890-1894 (2012)
- 2011
- [c6]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty: Deterministic test for the reproduction and detection of board-level functional failures. ASP-DAC 2011: 491-496
- [c5]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty: Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. European Test Symposium 2011: 195-200
- 2010
- [j2]Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara: RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences. J. Electronic Testing 26(2): 151-164 (2010)
- [c4]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty: Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. Asian Test Symposium 2010: 421-428
2000 – 2009
- 2009
- [j1]Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek: Deviation-Based LFSR Reseeding for Test-Data Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 259-271 (2009)
- [c3]Hongxia Fang, Krishnendu Chakrabarty, Rubin A. Parekhji: Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage. Asian Test Symposium 2009: 331-336
- [c2]Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara: RTL DFT techniques to enhance defect coverage for functional test sequences. HLDVT 2009: 160-165
- [c1]Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti: RT-Level Deviation-Based Grading of Functional Test Sequences. VTS 2009: 264-269
Coauthor Index
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last updated on 2012-09-26 07:17 CEST by the dblp team