E. Falck

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	2001
j1		M. Zmeck, J. C. H. Phang, A. Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess: Analysis of high-power devices using proton beam induced charge microscopy. Microelectronics Reliability 41(9-10): 1519-1524 (2001)

Coauthor Index

1	L. J. Balk	[j1]
2	R. Barthelmess	[j1]
3	A. Bettiol	[j1]
4	Franz-Josef Niedernostheide	[j1]
5	T. Osipowicz	[j1]
6	J. C. H. Phang	[j1]
7	Hans-Joachim Schulze	[j1]
8	F. Watt	[j1]
9	M. Zmeck	[j1]

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