Michiaki Emori

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	2008
j1		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008)
	2006
c4		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression of 100x for Scan-Based BIST. ITC 2006: 1-10
	2003
c3		Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama: BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364
	1997
c2		Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi: ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126-
	1990
c1		Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani: ASIC CAD system based on hierarchical design-for-testability. ITC 1990: 404-409

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