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T. Devoivre

2000 – 2009

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2002
[c1]
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  dblp key:
  - conf/mtdt/DevoivreLJCFTVGBHVTRGPTGRBPNPDLHH02
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T. Devoivre, M. Lunenborg, C. Julien, J.-P. Carrere, P. Ferreira, W. J. Toren, A. VandeGoor, P. Gayet, T. Berger, O. Hinsinger, P. Vannier, Y. Trouiller, Y. Rody, P.-J. Goirand, R. Palla, I. Thomas, F. Guyader, D. Roy, B. Borot, N. Planes, S. Naudet, F. Pico, D. Duca, F. Lalanne, D. Heslinga, M. Haond: Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC). MTDT 2002: 157-162
2001
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M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, Jalal Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta₂O₅ as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

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