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Francesca Danesin

2000 – 2009

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2008
[j4]
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  dblp key:
  - journals/mr/DanesinTZMZCLLPR08
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Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini: Thermal storage effects on AlGaN/GaN HEMT. Microelectronics Reliability 48(8-9): 1361-1365 (2008)
[j3]
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  dblp key:
  - journals/mr/TazzoliMZDZBLT08
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Augusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, P. Bove, R. Langer, J. Thorpe: Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. Microelectronics Reliability 48(8-9): 1370-1374 (2008)
2007
[j2]
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  dblp key:
  - journals/mr/FaqirVFDRMZCCLTD07
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M. Faqir, G. Verzellesi, Fausto Fantini, Francesca Danesin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua: Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. Microelectronics Reliability 47(9-11): 1639-1642 (2007)
2006
[j1]
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  - journals/mr/DanesinZGRMZP06
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Francesca Danesin, Franco Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella: Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability 46(9-11): 1750-1753 (2006)