| 2008 | ||
|---|---|---|
| j1 | A. Cuadras, B. Garrido, J. R. Morante, L. Fonseca: Leakage currents and dielectric breakdown of Si1-x-yGexCy thermal oxides. Microelectronics Reliability 48(10): 1635-1640 (2008) | |
| 1 | L. Fonseca | |
| 2 | B. Garrido | |
| 3 | J. R. Morante |
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