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Adalberto Nobiato Crespo

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2010 – today

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2016
[c9]
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Odair Jacinto da Silva, Adalberto Nobiato Crespo, Mario Jino:
Experimental Comparison of Software Reliability Models Based on Code Coverage and on Time Domain. QRS Companion 2016: 85-92
2010
[c8]
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Odair Jacinto da Silva, Adalberto Nobiato Crespo, Marcos Lordello Chaim, Mario Jino:
Sensitivity of Two Coverage-Based Software Reliability Models to Variations in the Operational Profile. SSIRI 2010: 113-120

2000 – 2009

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2009
[c7]
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Adalberto Nobiato Crespo, Alberto Pasquini, Mario Jino, José Carlos Maldonado:
Applying Code Coverage Approach to an Infinite Failure Software Reliability Model. SBES 2009: 216-226
2008
[j2]
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Adalberto Nobiato Crespo, Mario Jino, Alberto Pasquini, José Carlos Maldonado:
A binomial software reliability model based on coverage of structural testing criteria. Empirical Software Engineering 13(2): 185-209 (2008)
[c6]
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Jorge Luiz da Cruz, Mario Jino, Adalberto Nobiato Crespo, Miguel Argollo:
PROMETEU - a tool to support documents generation and traceability in the test process. JIISIC 2008: 133-138
[c5]
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Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Clenio F. Salviano, Mario Jino:
Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. JIISIC 2008: 147-154
[c4]
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Odair Jacinto da Silva, Adalberto Nobiato Crespo, Mario Jino:
Aplicação de um Checklist de Pré-Teste. JIISIC 2008: 313-318
2006
[c3]
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Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Mario Jino:
Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. PROFES 2006: 263-277
2004
[c2]
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Kival Chaves Weber, Ana Regina Rocha, Ana Cristina Rouiller, Adalberto Nobiato Crespo, Angela Maria Alves, Arnaldo Ayala, Austregésilo Gonçalves, Benito Diaz Paret, Carlos Vargas, Clenio F. Salviano, Cristina A. F. Machado, Danilo Scalet, Djalma Petit, Eratóstenes E. R. Araújo, José Carlos Maldonado, Káthia Marçal de Oliveira, Luis Carlos Oliveira, Márcio Girão, Márcio Pecegueiro do Amaral, Renata Campelo, Teresa M. Maciel:
Uma Estratégia para Melhoria de Processo de Software nas Empresas Brasileiras. QUATIC 2004: 73-78

1990 – 1999

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1996
[j1]
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Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella:
Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]. IEEE Trans. Reliability 45(4): 531-540 (1996)
[c1]
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Adalberto Nobiato Crespo, Paolo Matrella, Alberto Pasquini:
Sensitivity of reliability growth models to operational profile errors. ISSRE 1996: 35-44

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