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Wilfrid Claeys
2000 – 2009
- 2009
[j11]Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire: Joule expansion imaging techniques on microlectronic devices. Microelectronics Journal 40(9): 1367-1372 (2009)- 2008
- [j10]Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire: Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectronics Reliability 48(2): 204-211 (2008)
- [c2]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire: Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. European Test Symposium 2008: 47-52
- 2006
- [j9]Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006)
- 2005
- [j8]Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire: ElectroStatic Discharge Fault Localization by Laser Probing. Microelectronics Reliability 45(9-11): 1482-1486 (2005)
- 2004
- [j7]Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz: Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal 35(10): 797-803 (2004)
- [j6]Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale: Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal 35(10): 811-816 (2004)
- [j5]Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004)
- [j4]Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys: Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Transactions on Reliability 53(2): 293-296 (2004)
- 2003
- [j3]Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys: Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability 43(9-11): 1609-1613 (2003)
- [j2]G. Andriamonje, Vincent Pouget, Y. Ousten, Dean Lewis, Y. Danto, Jean-Michel Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
- 2000
- [c1]Josep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys: Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
1990 – 1999
- 1999
- [j1]Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto: Differential Thermal Testing: An Approach to its Feasibility. J. Electronic Testing 14(1-2): 57-66 (1999)
Coauthor Index
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last updated on 2012-09-10 15:59 CEST by the dblp team