Kiran V. Chatty

T. Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier: Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. Microelectronics Reliability 50(9-11): 1367-1372 (2010)

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix: Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability 49(12): 1407-1416 (2009)

David Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin: Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology. Microelectronics Reliability 49(12): 1417-1423 (2009)

Ciaran J. Brennan, Shunhua Chang, Min Woo, Kiran V. Chatty, Robert Gauthier: Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1030-1035 (2007)

Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier: Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1069-1073 (2007)

David Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)

Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)

Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245