Krishnendu Chakrabarty

Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor: Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electronic Testing 29(1): 35-48 (2013)

Yan Luo, Krishnendu Chakrabarty, Tsung-Yi Ho: Error Recovery in Cyberphysical Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 32(1): 59-72 (2013)

Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty, Yu-Hua Wu: Counter-Based Output Selection for Test Response Compaction. IEEE Trans. on CAD of Integrated Circuits and Systems 32(1): 152-164 (2013)

Brandon Noia, Krishnendu Chakrabarty: Pre-Bond Probing of Through-Silicon Vias in 3-D Stacked ICs. IEEE Trans. on CAD of Integrated Circuits and Systems 32(4): 547-558 (2013)

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu: Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting. IEEE Trans. on CAD of Integrated Circuits and Systems 32(5): 723-736 (2013)

Kai Hu, Bang-Ning Hsu, Andrew Madison, Krishnendu Chakrabarty, Richard B. Fair: Fault detection, real-time error recovery, and experimental demonstration for digital microfluidic biochips. DATE 2013: 559-564

Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Testing for SoCs with advanced static and dynamic power-management capabilities. DATE 2013: 737-742

Sergej Deutsch, Krishnendu Chakrabarty: Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels. DATE 2013: 1065-1070

Yang Zhao, Krishnendu Chakrabarty: Design and Testing of Digital Microfluidic Biochips. Springer 2012, isbn 978-1-4614-0369-2, pp. I-XI, 1-202

Krishnendu Chakrabarty: The Quest for High-Yield IC Manufacturing. IEEE Design & Test of Computers 29(1): 4 (2012)

Krishnendu Chakrabarty: Standards, Interoperability, and Innovation in a Disaggregated IC Industry. IEEE Design & Test of Computers 29(2): 4 (2012)

Krishnendu Chakrabarty: Looking ahead at the role of electronic design automation in synthetic biology [From the EIC]. IEEE Design & Test of Computers 29(3): 4 (2012)

Krishnendu Chakrabarty: Electronic Design Methods and Technologies for Green Buildings. IEEE Design & Test of Computers 29(4): 4 (2012)

Krishnendu Chakrabarty: Towards more digital content in wireless systems [From the EiC]. IEEE Design & Test of Computers 29(6): 4 (2012)

Brandon Noia, Krishnendu Chakrabarty, Erik Jan Marinissen: Optimization Methods for Post-Bond Testing of 3D Stacked ICs. J. Electronic Testing 28(1): 103-120 (2012)

Yang Zhao, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts. J. Electronic Testing 28(2): 243-255 (2012)

Sudip Roy, Debasis Mitra, Bhargab B. Bhattacharya, Krishnendu Chakrabarty: Congestion-aware layout design for high-throughput digital microfluidic biochips. JETC 8(3): 17 (2012)

Yang Zhao, Krishnendu Chakrabarty: Simultaneous Optimization of Droplet Routing and Control-Pin Mapping to Electrodes in Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 31(2): 242-254 (2012)

Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu: Reproduction and Detection of Board-Level Functional Failure. IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 630-643 (2012)

Yang Zhao, Krishnendu Chakrabarty: Cross-Contamination Avoidance for Droplet Routing in Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 31(6): 817-830 (2012)

Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu: Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. IEEE Trans. on CAD of Integrated Circuits and Systems 31(10): 1586-1599 (2012)

Yi-Ling Hsieh, Tsung-Yi Ho, Krishnendu Chakrabarty: A Reagent-Saving Mixing Algorithm for Preparing Multiple-Target Biochemical Samples Using Digital Microfluidics. IEEE Trans. on CAD of Integrated Circuits and Systems 31(11): 1656-1669 (2012)

Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji: Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands. IEEE Trans. on CAD of Integrated Circuits and Systems 31(11): 1754-1766 (2012)

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty: Physical-Defect Modeling and Optimization for Fault-Insertion Test. IEEE Trans. VLSI Syst. 20(4): 723-736 (2012)

Yang Zhao, Krishnendu Chakrabarty, Ryan Sturmer, Vamsee K. Pamula: Optimization Techniques for the Synchronization of Concurrent Fluidic Operations in Pin-Constrained Digital Microfluidic Biochips. IEEE Trans. VLSI Syst. 20(6): 1132-1145 (2012)

Li Jiang, Qiang Xu, Krishnendu Chakrabarty, T. M. Mak: Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint. IEEE Trans. VLSI Syst. 20(9): 1621-1633 (2012)

Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti: Functional Test-Sequence Grading at Register-Transfer Level. IEEE Trans. VLSI Syst. 20(10): 1890-1894 (2012)

Sergej Deutsch, Krishnendu Chakrabarty, Shreepad Panth, Sung Kyu Lim: TSV Stress-Aware ATPG for 3D Stacked ICs. ATS 2012: 31-36

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu: Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees. ATS 2012: 202-207

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu: Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines. ATS 2012: 208-213

Stephan Eggersglüß, Mahmut Yilmaz, Krishnendu Chakrabarty: Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization. ATS 2012: 290-295

Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty: Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits through High-Level Mutant Injection. ATS 2012: 302-307

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: On-Line Error Detection in Digital Microfluidic Biochips. ATS 2012: 332-337

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: Automated path planning for washing in digital microfluidic biochips. CASE 2012: 115-120

Yan Luo, Krishnendu Chakrabarty: Design of pin-constrained general-purpose digital microfluidic biochips. DAC 2012: 18-25

Fangming Ye, Krishnendu Chakrabarty: TSV open defects in 3D integrated circuits: characterization, test, and optimal spare allocation. DAC 2012: 1024-1030

Naghmeh Karimi, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil: Test generation for clock-domain crossing faults in integrated circuits. DATE 2012: 406-411

Michael Richter, Krishnendu Chakrabarty: Test pin count reduction for NoC-based Test delivery in multicore SOCs. DATE 2012: 787-792

Yan Luo, Krishnendu Chakrabarty, Tsung-Yi Ho: A cyberphysical synthesis approach for error recovery in digital microfluidic biochips. DATE 2012: 1239-1244

Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson: Re-using chip level DFT at board level. European Test Symposium 2012: 1

Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji: Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. European Test Symposium 2012: 1-6

Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty: Diagnostic system based on support-vector machines for board-level functional diagnosis. European Test Symposium 2012: 1-6

Yan Luo, Krishnendu Chakrabarty, Tsung-Yi Ho: Dictionary-based error recovery in cyberphysical digital-microfluidic biochips. ICCAD 2012: 369-376

Yi-Ling Hsieh, Tsung-Yi Ho, Krishnendu Chakrabarty: Design methodology for sample preparation on digital microfluidic biochips. ICCD 2012: 189-194

Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Shih-Shiun Chien, Krishnendu Chakrabarty: Accumulator-based output selection for test response compaction. ISCAS 2012: 2313-2316

Debasis Mitra, Sudip Roy, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: On-Chip Sample Preparation with Multiple Dilutions Using Digital Microfluidics. ISVLSI 2012: 314-319

Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty: A dynamic programming solution for optimizing test delivery in multicore SOCs. ITC 2012: 1-10

Brandon Noia, Shreepad Panth, Krishnendu Chakrabarty, Sung Kyu Lim: Scan test of die logic in 3D ICs using TSV probing. ITC 2012: 1-8

Masoud Zamani, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty: Ping-pong test: Compact test vector generation for reversible circuits. VTS 2012: 164-169

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty: Test and Diagnosis for Small-Delay Defects. Springer 2011, isbn 978-1-4419-8296-4, pp. I-XVIII, 1-212

Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty: A Metric to Target Small-Delay Defects in Industrial Circuits. IEEE Design & Test of Computers 28(2): 52-61 (2011)

Yang Zhao, Krishnendu Chakrabarty: Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates. J. Electronic Testing 27(1): 69-83 (2011)

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization Techniques. J. Electronic Testing 27(5): 657-671 (2011)

Brandon Noia, Krishnendu Chakrabarty: Test-wrapper optimisation for embedded cores in through-silicon via-based three-dimensional system on chips. IET Computers & Digital Techniques 5(3): 186-197 (2011)

Tong Zhou, Romit Roy Choudhury, Peng Ning, Krishnendu Chakrabarty: P2DAP - Sybil Attacks Detection in Vehicular Ad Hoc Networks. IEEE Journal on Selected Areas in Communications 29(3): 582-594 (2011)

Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 30(5): 787-791 (2011)

Yang Zhao, Tao Xu, Krishnendu Chakrabarty: Broadcast Electrode-Addressing and Scheduling Methods for Pin-Constrained Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 30(7): 986-999 (2011)

Brandon Noia, Krishnendu Chakrabarty, Sandeep Kumar Goel, Erik Jan Marinissen, Jouke Verbree: Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs. IEEE Trans. on CAD of Integrated Circuits and Systems 30(11): 1705-1718 (2011)

Zhen Chen, Krishnendu Chakrabarty, Dong Xiang: MVP: Minimum-Violations Partitioning for Reducing Capture Power in At-Speed Delay-Fault Testing. IEEE Trans. on CAD of Integrated Circuits and Systems 30(11): 1762-1767 (2011)

Xrysovalantis Kavousianos, Vasileios Tenentes, Krishnendu Chakrabarty, Emmanouil Kalligeros: Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. VLSI Syst. 19(12): 2330-2335 (2011)

Brandon Noia, Krishnendu Chakrabarty: Pre-bond testing of die logic and TSVs in high performance 3D-SICs. 3DIC 2011: 1-5

Uzair Shah Syed, Krishnendu Chakrabarty, Anshuman Chandra, Rohit Kapur: 3D-Scalable Adaptive Scan (3D-SAS). 3DIC 2011: 1-6

Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty: Deterministic test for the reproduction and detection of board-level functional failures. ASP-DAC 2011: 491-496

Naghmeh Karimi, Zhiqiu Kong, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil: Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip. Asian Test Symposium 2011: 7-14

Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji: Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands. Asian Test Symposium 2011: 33-39

Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor: On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage. Asian Test Symposium 2011: 120-125

Brandon Noia, Krishnendu Chakrabarty: Identification of Defective TSVs in Pre-Bond Testing of 3D ICs. Asian Test Symposium 2011: 187-194

Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty: Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. Asian Test Symposium 2011: 389-394

Brandon Noia, Krishnendu Chakrabarty: Testing and Design-for-Testability Techniques for 3D Integrated Circuits. Asian Test Symposium 2011: 474-479

Tsung-Yi Ho, Krishnendu Chakrabarty, Paul Pop: Digital microfluidic biochips: recent research and emerging challenges. CODES+ISSS 2011: 335-344

Krishnendu Chakrabarty, Paul Pop, Tsung-Yi Ho: Digital microfluidic biochips: functional diversity, more than moore, and cyberphysical systems. CODES+ISSS 2011: 377-378

Sudip Roy, Bhargab B. Bhattacharya, Krishnendu Chakrabarty: Waste-aware dilution and mixing of biochemical samples with digital microfluidic biochips. DATE 2011: 1059-1064

Krishnendu Chakrabarty: Testing and design-for-testability solutions for 3D integrated circuits. DDECS 2011: 5

Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty: Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. European Test Symposium 2011: 13-18

Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor: Critical Fault-Based Pattern Generation for Screening SDDs. European Test Symposium 2011: 177-182

Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty: Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. European Test Symposium 2011: 195-200

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: On residue removal in digital microfluidic biochips. ACM Great Lakes Symposium on VLSI 2011: 391-394

Krishnendu Chakrabarty, Gary Dispoto, Rick Bellamy, Jun Zeng: The role of EDA in digital print automation and infrastructure optimization. ICCAD 2011: 158-161

Tsung-Wei Huang, Tsung-Yi Ho, Krishnendu Chakrabarty: Reliability-oriented broadcast electrode-addressing for pin-constrained digital microfluidic biochips. ICCAD 2011: 448-455

Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty: A BIST scheme for testing and repair of multi-mode power switches. IOLTS 2011: 115-120

Yang Zhao, Krishnendu Chakrabarty: Co-optimization of droplet routing and pin assignment in disposable digital microfluidic biochips. ISPD 2011: 69-76

Brandon Noia, Krishnendu Chakrabarty: Pre-bond probing of TSVs in 3D stacked ICs. ITC 2011: 1-10

Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu: Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. ITC 2011: 1-9

Krishnendu Chakrabarty: Design and optimization methods for digital microfluidic biochips: A vision for functional diversity and more than moore. SoCC 2011: 5

Sudip Roy, Bhargab B. Bhattacharya, Partha Pratim Chakrabarti, Krishnendu Chakrabarty: Layout-Aware Solution Preparation for Biochemical Analysis on a Digital Microfluidic Biochip. VLSI Design 2011: 171-176

Zhaobo Zhang, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Yiorgos Tsiatouhas: A Robust and Reconfigurable Multi-mode Power Gating Architecture. VLSI Design 2011: 280-285

Krishnendu Chakrabarty, Tao Xu: Digital Microfluidic Biochips - Design Automation and Optimization. CRC Press 2010, isbn 978-1-4398-1915-9, pp. I-XIII, 1-199

Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara: RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences. J. Electronic Testing 26(2): 151-164 (2010)

Harshavardhan Sabbineni, Krishnendu Chakrabarty: An Energy-Efficient Data Delivery Scheme for Delay-Sensitive Traffic in Wireless Sensor Networks. IJDSN 2010 (2010)

Harshavardhan Sabbineni, Krishnendu Chakrabarty: Datacollection in Event-Driven Wireless Sensor Networks with Mobile Sinks. IJDSN 2010 (2010)

Krishnendu Chakrabarty: Editorial. JETC 6(1) (2010)

Yang Zhao, Tao Xu, Krishnendu Chakrabarty: Integrated control-path design and error recovery in the synthesis of digital microfluidic lab-on-chip. JETC 6(3) (2010)

Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie: Test-access mechanism optimization for core-based three-dimensional SOCs. Microelectronics Journal 41(10): 601-615 (2010)

Yang Zhao, Krishnendu Chakrabarty: Digital Microfluidic Logic Gates and Their Application to Built-in Self-Test of Lab-on-Chip. IEEE Trans. Biomed. Circuits and Systems 4(4): 250-262 (2010)

Tao Xu, Krishnendu Chakrabarty, Vamsee K. Pamula: Defect-Tolerant Design and Optimization of a Digital Microfluidic Biochip for Protein Crystallization. IEEE Trans. on CAD of Integrated Circuits and Systems 29(4): 552-565 (2010)

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 29(5): 760-773 (2010)

Krishnendu Chakrabarty, Richard B. Fair, Jun Zeng: Design Tools for Digital Microfluidic Biochips: Toward Functional Diversification and More Than Moore. IEEE Trans. on CAD of Integrated Circuits and Systems 29(7): 1001-1017 (2010)

S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod: Gate-Sizing-Based Single V_dd Test for Bridge Defects in Multivoltage Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 29(9): 1409-1421 (2010)

Sudip Roy, Bhargab B. Bhattacharya, Krishnendu Chakrabarty: Optimization of Dilution and Mixing of Biochemical Samples Using Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 29(11): 1696-1708 (2010)

Krishnendu Chakrabarty: Design Automation and Test Solutions for Digital Microfluidic Biochips. IEEE Trans. on Circuits and Systems 57-I(1): 4-17 (2010)

Yang Zhao, Krishnendu Chakrabarty: Testing of Low-Cost Digital Microfluidic Biochips with Non-regular Array Layouts. Asian Test Symposium 2010: 27-32

Debasis Mitra, Sarmishtha Ghoshal, Hafizur Rahaman, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: Testing of Digital Microfluidic Biochips Using Improved Eulerization Techniques and the Chinese Postman Problem. Asian Test Symposium 2010: 111-116

Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes: Defect Coverage-Driven Window-Based Test Compression. Asian Test Symposium 2010: 141-146

Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor: Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. Asian Test Symposium 2010: 307-312

Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection. Asian Test Symposium 2010: 331-336

Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty: Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. Asian Test Symposium 2010: 421-428

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty: Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. Asian Test Symposium 2010: 429-432

Yang Zhao, Krishnendu Chakrabarty: Synchronization of washing operations with droplet routing for cross-contamination avoidance in digital microfluidic biochips. DAC 2010: 635-640

S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Defect aware X-filling for low-power scan testing. DATE 2010: 873-878

Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty: High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. DATE 2010: 1426-1431

Rishad A. Shafik, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Soft error-aware design optimization of low power and time-constrained embedded systems. DATE 2010: 1462-1467

Brandon Noia, Sandeep Kumar Goel, Krishnendu Chakrabarty, Erik Jan Marinissen, Jouke Verbree: Test-architecture optimization for TSV-based 3D stacked ICs. European Test Symposium 2010: 24-29

Zhen Chen, Krishnendu Chakrabarty, Dong Xiang: MVP: Capture-power reduction with minimum-violations partitioning for delay testing. ICCAD 2010: 149-154

Yibo Chen, Dimin Niu, Yuan Xie, Krishnendu Chakrabarty: Cost-effective integration of three-dimensional (3D) ICs emphasizing testing cost analysis. ICCAD 2010: 471-476

Tsung-Yi Ho, Jun Zeng, Krishnendu Chakrabarty: Digital microfluidic biochips: A vision for functional diversity and more than moore. ICCAD 2010: 578-585

Krishnendu Chakrabarty: Digital Microfluidic Biochips: A Vision for Functional Diversity and More Than Moore. ISVLSI 2010: 3-4

Brandon Noia, Krishnendu Chakrabarty, Erik Jan Marinissen: Optimization methods for post-bond die-internal/external testing in 3D stacked ICs. ITC 2010: 193-201

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty: Board-level fault diagnosis using an error-flow dictionary. ITC 2010: 485-494

Alodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara: RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage. ITC 2010: 625-634

Yang Zhao, Ryan Sturmer, Krishnendu Chakrabarty, Vamsee K. Pamula: Synchronization of Concurrently-Implemented Fluidic Operations in Pin-Constrained Digital Microfluidic Biochips. VLSI Design 2010: 69-74

Krishnendu Chakrabarty: Digital Microfluidic Biochips: A Vision for Functional Diversity and More than Moore. VLSI Design 2010: 452-457

Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: A novel hybrid method for SDD pattern grading and selection. VTS 2010: 45-50

Yang Zhao, Krishnendu Chakrabarty: Pin-count-aware online testing of digital microfluidic biochips. VTS 2010: 111-116

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty: Board-level fault diagnosis using Bayesian inference. VTS 2010: 244-249

Hsien-Hsin S. Lee, Krishnendu Chakrabarty: Test Challenges for 3D Integrated Circuits. IEEE Design & Test of Computers 26(5): 26-35 (2009)

Bipul C. Paul, Krishnendu Chakrabarty: Advances in nanoelectronics circuits and systems [Editorial]. IET Computers & Digital Techniques 3(6): 551-552 (2009)

Vincent Mao, V. Thusu, Chris Dwyer, Krishnendu Chakrabarty: Connecting fabrication defects to fault models and SPICE simulations for DNA self-assembled nanoelectronics. IET Computers & Digital Techniques 3(6): 553-569 (2009)

Yang Zhao, Krishnendu Chakrabarty: On-Line Testing of Lab-on-Chip Using Reconfigurable Digital-Microfluidic Compactors. International Journal of Parallel Programming 37(4): 370-388 (2009)

Xiaoxia Wu, Paul Falkenstern, Krishnendu Chakrabarty, Yuan Xie: Scan-chain design and optimization for three-dimensional integrated circuits. JETC 5(2) (2009)

Bozena Kaminska, Krishnendu Chakrabarty: Guest Editorial - Selected Papers from the IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW), 2008. IEEE Trans. Biomed. Circuits and Systems 3(4): 193-194 (2009)

Tao Xu, Krishnendu Chakrabarty: Fault Modeling and Functional Test Methods for Digital Microfluidic Biochips. IEEE Trans. Biomed. Circuits and Systems 3(4): 241-253 (2009)

Sandeep Kumar Goel, Erik Jan Marinissen, Anuja Sehgal, Krishnendu Chakrabarty: Testing of SoCs with Hierarchical Cores: Common Fallacies, Test Access Optimization, and Test Scheduling. IEEE Trans. Computers 58(3): 409-423 (2009)

Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Test-Length and TAM Optimization for Wafer-Level Reduced Pin-Count Testing of Core-Based SoCs. IEEE Trans. on CAD of Integrated Circuits and Systems 28(1): 111-120 (2009)

Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek: Deviation-Based LFSR Reseeding for Test-Data Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 259-271 (2009)

Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang: Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. IEEE Trans. on CAD of Integrated Circuits and Systems 28(8): 1251-1264 (2009)

Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty: SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects. ACM Trans. Design Autom. Electr. Syst. 14(1) (2009)

Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar: Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs. IEEE Trans. VLSI Syst. 17(4): 587-592 (2009)

Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In. IEEE Trans. VLSI Syst. 17(12): 1730-1741 (2009)

Thomas Edison Yu, Tomokazu Yoneda, Krishnendu Chakrabarty, Hideo Fujiwara: Test infrastructure design for core-based system-on-chip under cycle-accurate thermal constraints. ASP-DAC 2009: 793-798

Hongxia Fang, Krishnendu Chakrabarty, Rubin A. Parekhji: Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage. Asian Test Symposium 2009: 331-336

Dong Xiang, Boxue Yin, Krishnendu Chakrabarty: Compact Test Generation for Small-Delay Defects Using Testable-Path Information. Asian Test Symposium 2009: 424-429

Tong Zhou, Romit Roy Choudhury, Krishnendu Chakrabarty: Diverse Routing: Exploiting Social Behavior for Routing in Delay-Tolerant Networks. CSE (4) 2009: 1115-1122

Xrysovalantis Kavousianos, Krishnendu Chakrabarty: Generation of compact test sets with high defect coverage. DATE 2009: 1130-1135

Yang Zhao, Krishnendu Chakrabarty: Cross-contamination avoidance for droplet routing in digital microfluidic biochips. DATE 2009: 1290-1295

Mahmut Yilmaz, Krishnendu Chakrabarty: Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects. DATE 2009: 1488-1493

Lara D. Oliver, Krishnendu Chakrabarty, Hisham Z. Massoud: Dual-threshold pass-transistor logic design. ACM Great Lakes Symposium on VLSI 2009: 291-296

Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara: RTL DFT techniques to enhance defect coverage for functional test sequences. HLDVT 2009: 160-165

Li Jiang, Qiang Xu, Krishnendu Chakrabarty, T. M. Mak: Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint. ICCAD 2009: 191-196

Brandon Noia, Krishnendu Chakrabarty, Yuan Xie: Test-wrapper optimization for embedded cores in TSV-based three-dimensional SOCs. ICCD 2009: 70-77

Krishnendu Chakrabarty: Testing bio-chips. ICCD 2009: 327

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty: Physical defect modeling for fault insertion in system reliability test. ITC 2009: 1-10

Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti: RT-Level Deviation-Based Grading of Functional Test Sequences. VTS 2009: 264-269

Tao Xu, Krishnendu Chakrabarty: Design-for-Testability for Digital Microfluidic Biochips. VTS 2009: 309-314

Philip Y. Paik, Vamsee K. Pamula, Krishnendu Chakrabarty: A Digital-Microfluidic Approach to Chip Cooling. IEEE Design & Test of Computers 25(4): 372-381 (2008)

Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing 24(4): 353-364 (2008)

Thomas Edison Yu, Tomokazu Yoneda, Krishnendu Chakrabarty, Hideo Fujiwara: Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips. IEICE Transactions 91-D(10): 2440-2448 (2008)

Fei Su, Krishnendu Chakrabarty: High-level synthesis of digital microfluidic biochips. JETC 3(4) (2008)

R. Iris Bahar, Krishnendu Chakrabarty: Introduction to joint ACM JETC/TODAES special issue on new, emerging, and specialized technologies. JETC 4(2) (2008)

Alvin R. Lebeck, Krishnendu Chakrabarty: Introduction to DAC 2007 special section. JETC 4(3) (2008)

Tao Xu, Krishnendu Chakrabarty: Integrated droplet routing and defect tolerance in the synthesis of digital microfluidic biochips. JETC 4(3) (2008)

Tao Xu, Krishnendu Chakrabarty, Fei Su: Defect-Aware High-Level Synthesis and Module Placement for Microfluidic Biochips. IEEE Trans. Biomed. Circuits and Systems 2(1): 50-62 (2008)

Zhanglei Wang, Krishnendu Chakrabarty: Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 352-365 (2008)

Soheil Samii, Mikko Selkälä, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng: Cycle-Accurate Test Power Modeling and Its Application to SoC Test Architecture Design and Scheduling. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 973-977 (2008)

Dong Xiang, Yang Zhao, Krishnendu Chakrabarty, Hideo Fujiwara: A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 999-1012 (2008)

Tao Xu, Krishnendu Chakrabarty: A Droplet-Manipulation Method for Achieving High-Throughput in Cross-Referencing-Based Digital Microfluidic Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 1905-1917 (2008)

R. Iris Bahar, Krishnendu Chakrabarty: Introduction to joint ACM JETC/TODAES special issue on new, emerging, and specialized technologies. ACM Trans. Design Autom. Electr. Syst. 13(2) (2008)

Anuja Sehgal, Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Power-aware SoC test planning for effective utilization of port-scalable testers. ACM Trans. Design Autom. Electr. Syst. 13(3) (2008)

Philip Y. Paik, Vamsee K. Pamula, Krishnendu Chakrabarty: Adaptive Cooling of Integrated Circuits Using Digital Microfluidics. IEEE Trans. VLSI Syst. 16(4): 432-443 (2008)

Zhanglei Wang, Krishnendu Chakrabarty: Test Data Compression Using Selective Encoding of Scan Slices. IEEE Trans. VLSI Syst. 16(11): 1429-1440 (2008)

Tao Xu, Krishnendu Chakrabarty: Broadcast electrode-addressing for pin-constrained multi-functional digital microfluidic biochips. DAC 2008: 173-178

Anders Larsson, Erik Larsson, Krishnendu Chakrabarty, Petru Eles, Zebo Peng: Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns. DATE 2008: 188-193

Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz: Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. DATE 2008: 1103-1106

Tao Xu, Krishnendu Chakrabarty, Vamsee K. Pamula: Design and optimization of a digital microfluidic biochip for protein crystallization. ICCAD 2008: 297-301

Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie: Test-access mechanism optimization for core-based three-dimensional SOCs. ICCD 2008: 212-218

Yang Zhao, Krishnendu Chakrabarty: On-Line Testing of Lab-on-Chip Using Digital Microfluidic Compactors. IOLTS 2008: 213-218

Tao Xu, Krishnendu Chakrabarty: Automated design of digital microfluidic lab-on-chip under pin-count constraints. ISPD 2008: 190-198

Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty: SOC Test Optimization with Compression-Technique Selection. ITC 2008: 1

Vincent Mao, Chris Dwyer, Krishnendu Chakrabarty: Fabrication Defects and Fault Models for DNA Self-Assembled Nanoelectronics. ITC 2008: 1-10

Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie: Test-Access Solutions for Three-Dimensional SOCs. ITC 2008: 1

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects. ITC 2008: 1-10

Yang Zhao, Tao Xu, Krishnendu Chakrabarty: Built-in Self-Test and Fault Diagnosis for Lab-on-Chip Using Digital Microfluidic Logic Gates. ITC 2008: 1-10

Yang Zhao, Tao Xu, Krishnendu Chakrabarty: Digital Microfluidic Logic Gates. NanoNet 2008: 54-60

Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. VTS 2008: 193-198

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: Test-Pattern Grading and Pattern Selection for Small-Delay Defects. VTS 2008: 233-239

Krishnendu Chakrabarty, Fei Su: Digital Microfluidic Biochips - Synthesis, Testing, and Reconfiguration Techniques. CRC Press 2007, isbn 978-0-8493-9009-8, pp. 1-228

Krishnendu Chakrabarty, Roland Thewes: Guest Editors' Introduction: Biochips and Integrated Biosensor Platforms. IEEE Design & Test of Computers 24(1): 8-9 (2007)

Zhanglei Wang, Krishnendu Chakrabarty: Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. J. Electronic Testing 23(2-3): 145-161 (2007)

Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty: Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips. J. Electronic Testing 23(2-3): 219-233 (2007)

Yi Zou, Krishnendu Chakrabarty: Redundancy Analysis and a Distributed Self-Organization Protocol for Fault-Tolerant Wireless Sensor Networks. IJDSN 3(3): 243-272 (2007)

Krishnendu Chakrabarty, Sachin S. Sapatnekar: Editorial to special issue DAC 2006. JETC 3(3) (2007)

Tao Xu, William L. Hwang, Fei Su, Krishnendu Chakrabarty: Automated design of pin-constrained digital microfluidic biochips under droplet-interference constraints. JETC 3(3) (2007)

Tao Xu, Krishnendu Chakrabarty: Parallel Scan-Like Test and Multiple-Defect Diagnosis for Digital Microfluidic Biochips. IEEE Trans. Biomed. Circuits and Systems 1(2): 148-158 (2007)

Anuja Sehgal, Krishnendu Chakrabarty: Optimization of Dual-Speed TAM Architectures for Efficient Modular Testing of SOCs. IEEE Trans. Computers 56(1): 120-133 (2007)

Qiang Xu, Nicola Nicolici, Krishnendu Chakrabarty: Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1539-1547 (2007)

Yi Zou, Krishnendu Chakrabarty: Distributed Mobility Management for Target Tracking in Mobile Sensor Networks. IEEE Trans. Mob. Comput. 6(8): 872-887 (2007)

Lei Li, Zhanglei Wang, Krishnendu Chakrabarty: Scan-BIST based on cluster analysis and the encoding of repeating sequences. ACM Trans. Design Autom. Electr. Syst. 12(1) (2007)

Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Wafer-Level Modular Testing of Core-Based SoCs. IEEE Trans. VLSI Syst. 15(10): 1144-1154 (2007)

Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar: AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. ASP-DAC 2007: 823-828

Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty: SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects. DAC 2007: 676-681

Tao Xu, Krishnendu Chakrabarty: Integrated Droplet Routing in the Synthesis of Microfluidic Biochips. DAC 2007: 948-953

Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang: SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE 2007: 201-206

Tao Xu, Krishnendu Chakrabarty: A cross-referencing-based droplet manipulation method for high-throughput and pin-constrained digital microfluidic arrays. DATE 2007: 552-557

Krishnendu Chakrabarty: Design and Test of Microfluidic Biochips. DDECS 2007: 17

Tao Xu, Krishnendu Chakrabarty: Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips. European Test Symposium 2007: 63-68

Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek: A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. European Test Symposium 2007: 125-130

Tao Xu, Krishnendu Chakrabarty: Functional testing of digital microfluidic biochips. ITC 2007: 1-10

Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty: Test-wrapper designs for the detection of signal-integrity faults on core-external interconnects of SoCs. ITC 2007: 1-9

Tong Zhou, Romit Roy Choudhury, Peng Ning, Krishnendu Chakrabarty: Privacy-Preserving Detection of Sybil Attacks in Vehicular Ad Hoc Networks. MobiQuitous 2007: 1-8

Amit Kumar, Krishnendu Chakrabarty, Chunduri Rama Mohan: An ECO Technique for Removing Crosstalk Violations in Clock Networks. VLSI Design 2007: 283-288

Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Test-Length Selection and TAM Optimization for Wafer-Level, Reduced Pin-Count Testing of Core-Based Digital SoCs. VLSI Design 2007: 459-464

Tao Xu, Krishnendu Chakrabarty, Fei Su: Defect-Aware Synthesis of Droplet-Based Microfluidic Biochips. VLSI Design 2007: 647-652

Fei Su, Krishnendu Chakrabarty, Vamsee K. Pamula: Yield Enhancement of Digital Microfluidics-Based Biochips Using Space Redundancy and Local Reconfiguration. CoRR abs/0710.4672 (2007)

Fei Su, Krishnendu Chakrabarty: Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic Biochips. CoRR abs/0710.4673 (2007)

Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. CoRR abs/0710.4686 (2007)

Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Rapid Generation of Thermal-Safe Test Schedules. CoRR abs/0710.4797 (2007)

Fei Su, Sule Ozev, Krishnendu Chakrabarty: Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. J. Electronic Testing 22(2): 199-210 (2006)

Fei Su, Krishnendu Chakrabarty: Yield enhancement of reconfigurable microfluidics-based biochips using interstitial redundancy. JETC 2(2): 104-128 (2006)

Ying Zhang, Krishnendu Chakrabarty: A unified approach for fault tolerance and dynamic power management in fixed-priority real-time embedded systems. IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 111-125 (2006)

Fei Su, Krishnendu Chakrabarty, Richard B. Fair: Microfluidics-Based Biochips: Technology Issues, Implementation Platforms, and Design-Automation Challenges. IEEE Trans. on CAD of Integrated Circuits and Systems 25(2): 211-223 (2006)

Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2502-2512 (2006)

Fei Su, Krishnendu Chakrabarty: Defect Tolerance Based on Graceful Degradation and Dynamic Reconfiguration for Digital Microfluidics-Based Biochips. IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 2944-2953 (2006)

Fei Su, Sule Ozev, Krishnendu Chakrabarty: Concurrent testing of digital microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(2): 442-464 (2006)

Fei Su, Krishnendu Chakrabarty: Module placement for fault-tolerant microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(3): 682-710 (2006)

Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: Test infrastructure design for mixed-signal SOCs with wrapped analog cores. IEEE Trans. VLSI Syst. 14(3): 292-304 (2006)

Tao Xu, Krishnendu Chakrabarty: Droplet-trace-based array partitioning and a pin assignment algorithm for the automated design of digital microfluidic biochips. CODES+ISSS 2006: 112-117

William L. Hwang, Fei Su, Krishnendu Chakrabarty: Automated design of pin-constrained digital microfluidic arrays for lab-on-a-chip applications*. DAC 2006: 925-930

Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty: Hierarchy-aware and area-efficient test infrastructure design for core-based system chips. DATE 2006: 285-290

Fei Su, William L. Hwang, Krishnendu Chakrabarty: Droplet routing in the synthesis of digital microfluidic biochips. DATE 2006: 323-328

Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel: Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE 2006: 1270-1275

Krishnendu Chakrabarty: Reconfiguration-Based Defect Tolerance for Microfluidic Biochips. DFT 2006

Lara D. Oliver, Krishnendu Chakrabarty, Hisham Z. Massoud: An evaluation of the impact of gate oxide tunneling on dual-V_t-based leakage reduction techniques. ACM Great Lakes Symposium on VLSI 2006: 105-110

Krishnendu Chakrabarty: Automated Design of Microfluidics-Based Biochips: Connecting Biochemistry to Electronics CAD. ICCD 2006

Sudarshan Bahukudumbi, Krishnendu Chakrabarty: Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs. ITC 2006: 1-10

Soheil Samii, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng: Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling. ITC 2006: 1-10

Tong Zhou, Krishnendu Chakrabarty: Authentication of sensor network flooding based on neighborhood cooperation. WCNC 2006: 665-670

Krishnendu Chakrabarty, S. Sitharama Iyengar: Scalable infrastructure for distributed sensor networks. Springer 2005, isbn 978-1-85233-951-7, pp. I-XIV, 1-194

Krishnendu Chakrabarty, Jun Zeng: Design automation for microfluidics-based biochips. JETC 1(3): 186-223 (2005)

Harshavardhan Sabbineni, Krishnendu Chakrabarty: Location-Aided Flooding: An Energy-Efficient Data Dissemination Protocol for Wireless Sensor Networks. IEEE Trans. Computers 54(1): 36-46 (2005)

Yi Zou, Krishnendu Chakrabarty: A Distributed Coverage- and Connectivity-Centric Technique for Selecting Active Nodes in Wireless Sensor Networks. IEEE Trans. Computers 54(8): 978-991 (2005)

Krishnendu Chakrabarty, Vikram Iyengar, Mark D. Krasniewski: Test planning for modular testing of hierarchical SOCs. IEEE Trans. on CAD of Integrated Circuits and Systems 24(3): 435-448 (2005)

Vishnu Swaminathan, Krishnendu Chakrabarty: Pruning-based, energy-optimal, deterministic I/O device scheduling for hard real-time systems. ACM Trans. Embedded Comput. Syst. 4(1): 141-167 (2005)

Mohammad Tehranipoor, Mehrdad Nourani, Krishnendu Chakrabarty: Nine-coded compression technique for testing embedded cores in SoCs. IEEE Trans. VLSI Syst. 13(6): 719-731 (2005)

Chunsheng Liu, Krishnendu Chakrabarty: Design and analysis of compact dictionaries for diagnosis in scan-BIST. IEEE Trans. VLSI Syst. 13(8): 979-984 (2005)

Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty: Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64

Krishnendu Chakrabarty, Fei Su: System-level design automation tools for digital microfluidic biochips. CODES+ISSS 2005: 201-206

Qiang Xu, Nicola Nicolici, Krishnendu Chakrabarty: Multi-frequency wrapper design and optimization for embedded cores under average power constraints. DAC 2005: 123-128

Fei Su, Krishnendu Chakrabarty: Unified high-level synthesis and module placement for defect-tolerant microfluidic biochips. DAC 2005: 825-830

Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. DATE 2005: 50-55

Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Rapid Generation of Thermal-Safe Test Schedules. DATE 2005: 840-845

Lei Li, Krishnendu Chakrabarty: Hybrid BIST Based on Repeating Sequences and Cluster Analysis. DATE 2005: 1142-1147

Fei Su, Krishnendu Chakrabarty, Vamsee K. Pamula: Yield Enhancement of Digital Microfluidics-Based Biochips Using Space Redundancy and Local Reconfiguration. DATE 2005: 1196-1201

Fei Su, Krishnendu Chakrabarty: Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic Biochips. DATE 2005: 1202-1207

Yi Zou, Krishnendu Chakrabarty: Fault-Tolerant Self-organization in Sensor Networks. DCOSS 2005: 191-205

Enkelejda Tafaj, Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty: Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling. DFT 2005: 544-551

Anuja Sehgal, Krishnendu Chakrabarty: Test planning for the effective utilization of port-scalable testers for heterogeneous core-based SOCs. ICCAD 2005: 88-93

Krishnendu Chakrabarty, J. E. Chen: A cocktail approach on random access scan toward low power and high efficiency test. ICCAD 2005: 94-99

Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. ICCD 2005: 137-142

Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty: Defect-oriented testing and diagnosis of digital microfluidics-based biochips. ITC 2005: 10

Zhanglei Wang, Krishnendu Chakrabarty: Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. ITC 2005: 10

Zhanglei Wang, Krishnendu Chakrabarty: Test data compression for IP embedded cores using selective encoding of scan slices. ITC 2005: 10

Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan: Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores. VLSI Design 2005: 53-58

Krishnendu Chakrabarty: Design, Testing, and Applications of Digital Microfluidics-Based Biochips. VLSI Design 2005: 221-226

Fei Su, Krishnendu Chakrabarty: Defect Tolerance for Gracefully-Degradable Microfluidics-Based Biochips. VTS 2005: 321-326

Anshuman Chandra, Krishnendu Chakrabarty: Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. J. Electronic Testing 20(2): 199-212 (2004)

Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger: A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electronic Testing 20(6): 611-622 (2004)

Lei Li, Krishnendu Chakrabarty: On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression. J. Electronic Testing 20(6): 667-670 (2004)

Yi Zou, Krishnendu Chakrabarty: Uncertainty-aware and coverage-oriented deployment for sensor networks. J. Parallel Distrib. Comput. 64(7): 788-798 (2004)

Chunsheng Liu, Krishnendu Chakrabarty: Compact Dictionaries for Fault Diagnosis in Scan-BIST. IEEE Trans. Computers 53(6): 775-780 (2004)

Tianhao Zhang, Krishnendu Chakrabarty, Richard B. Fair: Behavioral modeling and performance evaluation of microelectrofluidics-based PCR systems using SystemC. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 843-858 (2004)

Lei Li, Krishnendu Chakrabarty: Test set embedding for deterministic BIST using a reconfigurable interconnection network. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1289-1305 (2004)

Vishnu Swaminathan, Krishnendu Chakrabarty: Network flow techniques for dynamic voltage scaling in hard real-time systems. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1385-1398 (2004)

Chunsheng Liu, Krishnendu Chakrabarty: Identification of error-capturing scan cells in scan-BIST with applications to system-on-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1447-1459 (2004)

Yi Zou, Krishnendu Chakrabarty: Sensor deployment and target localization in distributed sensor networks. ACM Trans. Embedded Comput. Syst. 3(1): 61-91 (2004)

Ying Zhang, Krishnendu Chakrabarty: Dynamic adaptation for fault tolerance and power management in embedded real-time systems. ACM Trans. Embedded Comput. Syst. 3(2): 336-360 (2004)

Qishi Wu, Nageswara S. V. Rao, Jacob Barhen, S. Sitharama Iyengar, Vijay K. Vaishnavi, Hairong Qi, Krishnendu Chakrabarty: On Computing Mobile Agent Routes for Data Fusion in Distributed Sensor Networks. IEEE Trans. Knowl. Data Eng. 16(6): 740-753 (2004)

Anuja Sehgal, Vikram Iyengar, Krishnendu Chakrabarty: SOC test planning using virtual test access architectures. IEEE Trans. VLSI Syst. 12(12): 1263-1276 (2004)

Ying Zhang, Robert P. Dick, Krishnendu Chakrabarty: Energy-aware deterministic fault tolerance in distributed real-time embedded systems. DAC 2004: 550-555

Anuja Sehgal, Krishnendu Chakrabarty: Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures. DATE 2004: 422-427

Ying Zhang, Krishnendu Chakrabarty: Task Feasibility Analysis and Dynamic Voltage Scaling in Fault-Tolerant Real-Time Embedded Systems. DATE 2004: 1170-1175

Mohammad H. Tehranipour, Mehrdad Nourani, Krishnendu Chakrabarty: Nine-Coded Compression Technique with Application to Reduced Pin-Count Testing and Flexible On-Chip Decompression. DATE 2004: 1284-1289

Fei Su, Krishnendu Chakrabarty: Architectural-level synthesis of digital microfluidics-based biochips. ICCAD 2004: 223-228

Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton: Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST. ISVLSI 2004: 173-178

Fei Su, Krishnendu Chakrabarty: Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays. ITC 2004: 883-892

Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty: IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores. ITC 2004: 1203-1212

Yi Zou, Krishnendu Chakrabarty: Target localization based on energy considerations in distributed sensor networks. Ad Hoc Networks 1(2-3): 261-272 (2003)

Anshuman Chandra, Krishnendu Chakrabarty: Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes. IEEE Trans. Computers 52(8): 1076-1088 (2003)

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip. IEEE Trans. Computers 52(12): 1619-1632 (2003)

Anshuman Chandra, Krishnendu Chakrabarty: A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 352-363 (2003)

Chunsheng Liu, Krishnendu Chakrabarty: Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment. IEEE Trans. on CAD of Integrated Circuits and Systems 22(5): 593-604 (2003)

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Efficient test access mechanism optimization for system-on-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 22(5): 635-643 (2003)

Vishnu Swaminathan, Krishnendu Chakrabarty: Energy-conscious, deterministic I/O device scheduling in hard real-time systems. IEEE Trans. on CAD of Integrated Circuits and Systems 22(7): 847-858 (2003)

Krishnendu Chakrabarty, Markus Seuring: Space compaction of test responses using orthogonal transmission functions [logic testing]. IEEE T. Instrumentation and Measurement 52(5): 1353-1362 (2003)

Sunil R. Das, M. Sudarma, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Krishnendu Chakrabarty, Mehmet Sahinoglu: Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets. IEEE T. Instrumentation and Measurement 52(5): 1363-1380 (2003)

Lei Li, Krishnendu Chakrabarty, Nur A. Touba: Test data compression using dictionaries with selective entries and fixed-length indices. ACM Trans. Design Autom. Electr. Syst. 8(4): 470-490 (2003)

Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski, Krishnendu Chakrabarty: Test cost reduction for SOCs using virtual TAMs and lagrange multipliers. DAC 2003: 738-743

Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty: EBIST: A Novel Test Generator with Built-In Fault Detection Capability. DATE 2003: 10224-10229

Chunsheng Liu, Krishnendu Chakrabarty: A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis. DATE 2003: 10230-10237

Ying Zhang, Krishnendu Chakrabarty: Energy-Aware Adaptive Checkpointing in Embedded Real-Time Systems. DATE 2003: 10918-10925

Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty: A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization. DATE 2003: 11188-11190

Ying Zhang, Krishnendu Chakrabarty: Fault Recovery Based on Checkpointing for Hard Real-Time Embedded Systems. DFT 2003: 320-327

Yi Zou, Krishnendu Chakrabarty: Uncertainty-aware sensor deployment algorithms for surveillance applications. GLOBECOM 2003: 2972-2976

Vamsee K. Pamula, Krishnendu Chakrabarty: Cooling of integrated circuits using droplet-based microfluidics. ACM Great Lakes Symposium on VLSI 2003: 84-87

Vishnu Swaminathan, Krishnendu Chakrabarty: Generalized Network Flow Techniques for Dynamic Voltage Scaling in Hard Real-Time Systems. ICCAD 2003: 21-25

Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. ICCAD 2003: 95-99

Ying Zhang, Krishnendu Chakrabarty, Vishnu Swaminathan: Energy-Aware Fault Tolerance in Fixed-Priority Real-Time Embedded Systems. ICCAD 2003: 209-214

Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty: On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. ICCD 2003: 387-396

Yi Zou, Krishnendu Chakrabarty: Sensor Deployment and Target Localization Based on Virtual Forces. INFOCOM 2003

Chunsheng Liu, Krishnendu Chakrabarty: Compact Dictionaries for Fault Diagnosis in BIST. ISQED 2003: 105-110

Lei Li, Krishnendu Chakrabarty: Deterministic BIST Based on a Reconfigurable Interconnection Network. ITC 2003: 460-469

Fei Su, Sule Ozev, Krishnendu Chakrabarty: Testing of Droplet-Based Microelectrofluidic Systems. ITC 2003: 1192-1200

Yi Zou, Krishnendu Chakrabarty: Energy-Aware Target Localization in Wireless Sensor Networks. PerCom 2003: 60-

Lei Li, Krishnendu Chakrabarty: Test Data Compression Using Dictionaries with Fixed-Length Indices. VTS 2003: 219-224

Vikram Iyengar, Krishnendu Chakrabarty, Mark D. Krasniewski, Gopind N. Kumar: Design and Optimization of Multi-level TAM Architectures for Hierarchical SOCs. VTS 2003: 299-312

Santpal Singh Dhillon, Krishnendu Chakrabarty: Sensor placement for effective coverage and surveillance in distributed sensor networks. WCNC 2003: 1609-1614

Krishnendu Chakrabarty, Vikram Iyengar, Anshuman Chandra: Test Resource Partitioning for System-on-a-Chip. Frontiers in electronic testing 20, Kluwer / Springer 2002, isbn 978-1-4020-7119-5, pp. I-XII, 1-232

Krishnendu Chakrabarty, Erik Jan Marinissen: How Useful are the ITC 02 SoC Test Benchmarks? IEEE Design & Test of Computers 19(5): 120, 119 (2002)

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip. J. Electronic Testing 18(2): 213-230 (2002)

Krishnendu Chakrabarty: Guest Editorial. J. Electronic Testing 18(4-5): 363 (2002)

Hairong Qi, Xiaoling Wang, S. Sitharama Iyengar, Krishnendu Chakrabarty: High Performance Sensor Integration in Distributed Sensor Networks Using Mobile Agents. IJHPCA 16(3): 325-335 (2002)

Vikram Iyengar, Krishnendu Chakrabarty: Test Bus Sizing for System-on-a-Chip. IEEE Trans. Computers 51(5): 449-459 (2002)

Krishnendu Chakrabarty, S. Sitharama Iyengar, Hairong Qi, Eungchun Cho: Grid Coverage for Surveillance and Target Location in Distributed Sensor Networks. IEEE Trans. Computers 51(12): 1448-1453 (2002)

Anshuman Chandra, Krishnendu Chakrabarty: Low-power scan testing and test data compression forsystem-on-a-chip. IEEE Trans. on CAD of Integrated Circuits and Systems 21(5): 597-604 (2002)

Anshuman Chandra, Krishnendu Chakrabarty: Test data compression and decompression based on internal scanchains and Golomb coding. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 715-722 (2002)

Tianhao Zhang, Krishnendu Chakrabarty, Richard B. Fair: Design of reconfigurable composite microsystems based on hardware/software codesign principles. IEEE Trans. on CAD of Integrated Circuits and Systems 21(8): 987-995 (2002)

Vikram Iyengar, Krishnendu Chakrabarty: System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints. IEEE Trans. on CAD of Integrated Circuits and Systems 21(9): 1088-1094 (2002)

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Synthesis of single-output space compactors for scan-based sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 21(10): 1171-1179 (2002)

Sunil R. Das, Jing Yi Liang, Emil M. Petriu, Mansour H. Assaf, Wen-Ben Jone, Krishnendu Chakrabarty: Data compression in space under generalized mergeability based on concepts of cover table and frequency ordering. IEEE T. Instrumentation and Measurement 51(1): 150-172 (2002)

Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Robust Space Compaction of Test Responses. Asian Test Symposium 2002: 254-259

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Recent Advances in Test Planning for Modular Testing of Core-Based SOCs. Asian Test Symposium 2002: 320-

Vishnu Swaminathan, Krishnendu Chakrabarty: Pruning-based energy-optimal device scheduling for hard real-time systems. CODES 2002: 175-180

Anshuman Chandra, Krishnendu Chakrabarty: Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. DAC 2002: 673-678

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Wrapper/TAM co-optimization, constraint-driven test scheduling, and tester data volume reduction for SOCs. DAC 2002: 685-690

Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel: An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. DATE 2002: 382-386

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: Efficient Wrapper/TAM Co-Optimization for Large SOCs. DATE 2002: 491-498

Anshuman Chandra, Krishnendu Chakrabarty: Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression. DATE 2002: 598-603

Erik Jan Marinissen, Vikram Iyengar, Krishnendu Chakrabarty: A Set of Benchmarks fo Modular Testing of SOCs. ITC 2002: 519-528

Vikram Iyengar, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty: Test Resource Optimization for Multi-Site Testing of SOCs Under ATE Memory Depth Constraints. ITC 2002: 1159-1168

Vishnu Swaminathan, Charles B. Schweizer, Krishnendu Chakrabarty, Amil A. Patel: Experiences in Implementing an Energy-Driven Task Scheduler in RT-Linux. IEEE Real Time Technology and Applications Symposium 2002: 229-238

Anshuman Chandra, Krishnendu Chakrabarty, Rafael A. Medina: How Effective are Compression Codes for Reducing Test Data Volume? VTS 2002: 91-96

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen: On Using Rectangle Packing for SOC Wrapper/TAM Co-Optimization. VTS 2002: 253-258

Anshuman Chandra, Krishnendu Chakrabarty: Test Resource Partitioning for SOCs. IEEE Design & Test of Computers 18(5): 80-91 (2001)

Shivakumar Swaminathan, Krishnendu Chakrabarty: On Using Twisted-Ring Counters for Test Set Embedding in BIST. J. Electronic Testing 17(6): 529-542 (2001)

Anshuman Chandra, Krishnendu Chakrabarty: System-on-a-chip test-data compression and decompressionarchitectures based on Golomb codes. IEEE Trans. on CAD of Integrated Circuits and Systems 20(3): 355-368 (2001)

Jie Ding, Krishnendu Chakrabarty, Richard B. Fair: Scheduling of microfluidic operations for reconfigurabletwo-dimensional electrowetting arrays. IEEE Trans. on CAD of Integrated Circuits and Systems 20(12): 1463-1468 (2001)

Krishnendu Chakrabarty: Optimal test access architectures for system-on-a-chip. ACM Trans. Design Autom. Electr. Syst. 6(1): 26-49 (2001)