| 2008 | ||
|---|---|---|
| j1 | Weidong Kuang, Lizhi Cao, C. Yu, J. S. Yuan: PMOS breakdown effects on digital circuits - Modeling and analysis. Microelectronics Reliability 48(8-9): 1597-1600 (2008) | |
| 1 | Weidong Kuang | |
| 2 | C. Yu | |
| 3 | J. S. Yuan |
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