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Frank Brunner

2010 – today

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2011
[j3]
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Joachim Würfl, Eldad Bahat-Treidel, Frank Brunner, E. Cho, O. Hilt, Ponky Ivo, A. Knauer, Paul Kurpas, Richard Lossy, M. Schulz, S. Singwald, Markus Weyers, R. Zhytnytska: Reliability issues of GaN based high voltage power devices. Microelectronics Reliability 51(9-11): 1710-1716 (2011)

2000 – 2009

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2003
[j2]
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Frank Brunner, A. Braun, Paul Kurpas, J. Schneider, Joachim Würfl, Markus Weyers: Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. Microelectronics Reliability 43(6): 839-844 (2003)
2001
[j1]
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Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers: Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. Microelectronics Reliability 41(8): 1103-1108 (2001)

Coauthor Index

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What is the meaning of the colors in the coauthor index?