E. M. J. G. Bruls
List of publications from the DBLP Bibliography Server - FAQ
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 | 1997 | |
|---|---|---|
| c7 |      | R. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien: Built-in self-test methodology for A/D converters. ED&TC 1997: 353-358 |
| 1996 | ||
| j1 | | Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras: Bridging defects resistance in the metal layer of a CMOS process. J. Electronic Testing 8(1): 35-46 (1996) |
| c6 | | Marly Roncken, Eric Bruls: Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. ITC 1996: 205-214 |
| 1994 | ||
| c5 | | Eric Bruls: Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. ITC 1994: 562-571 |
| c4 | | R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, Keith Baker: Analogue Fault Simulation Based on Layout-Dependent Fault Models. ITC 1994: 641-649 |
| 1993 | ||
| c3 | | M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess: Parameter Monitoring: Advantages and Pitfalls. ITC 1993: 115-124 |
| 1992 | ||
| c2 | | Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls: Bridging Defects Resistance Measurements in a CMOS Process. ITC 1992: 892-899 |
| 1991 | ||
| c1 | | Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess: A Generic Method to Develop a Defect Monitoring System for IC Processes. ITC 1991: 218-227 |
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