A. J. Bhavnagarwala Coauthor index pubzone.org

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j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Rosana Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002)

Coauthor Index

1Kerry Bernstein
[j1]
2Ching-Te Chuang
[j1]
3Rajiv V. Joshi
[j1]
4S. Kowalczyk
[j1]
5Barry P. Linder
[j1]
6Salvatore Lombardo
[j1]
7Gregory A. Northrop
[j1]
8Rosana Rodríguez
[j1]
9James H. Stathis
[j1]
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