Thomas Bartenstein

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	2010
j1		Anis Uzzaman, Brion L. Keller, Brian Foutz, Sandeep Bhatia, Thomas Bartenstein, Masayuki Arai, Kazuhiko Iwasaki: Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression. IEICE Transactions 93-D(1): 17-23 (2010)
	2005
c6		Brion L. Keller, Thomas Bartenstein: Use of MISRs for compression and diagnostics. ITC 2005: 9
	2004
c5		Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane: An Economic Analysis and ROI Model for Nanometer Test. ITC 2004: 518-524
c4		Thomas Bartenstein: Panel 9 - Diagnostics vs. Failure Analysis. ITC 2004: 1439
	2001
c3		Thomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski: Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. ITC 2001: 287-296
	2000
c2		Thomas Bartenstein: Fault distinguishing pattern generation. ITC 2000: 820-828
	1997
c1		Gilbert Vandling, Thomas Bartenstein: Fault Model Extension for Diagnosing Custom Cell Fails. ITC 1997: 617-624

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