| 2011 | ||
|---|---|---|
| j5 | P. M. Dupuy, P. Austin, G. W. Delaney, M. P. Schwarz: Pore scale definition and computation from tomography data. Computer Physics Communications 182(10): 2249-2258 (2011) | |
| 2008 | ||
| j4 | J. L. Fock-Sui-Too, B. Chauchat, P. Austin, Patrick Tounsi, Michel Mermet-Guyennet, R. Meuret: Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectronics Reliability 48(8-9): 1453-1458 (2008) | |
| 2006 | ||
| j3 | C. Caramel, P. Austin, J. L. Sanchez, E. Imbernon, M. Breil: Integrated IGBT short-circuit protection structure: Design and optimization. Microelectronics Journal 37(3): 249-256 (2006) | |
| 2004 | ||
| j2 | A. Bourennane, M. Breil, J. L. Sanchez, P. Austin, J. Jalade: A new triggering mode in a vertical bi-directional MOS-thyristor device. Microelectronics Journal 35(3): 277-285 (2004) | |
| j1 | G. Bonnet, P. Austin, J. L. Sanchez: New distributed model of NPT IGBT dedicated to power circuits design. Microelectronics Reliability 44(1): 79-88 (2004) | |
Colors in the list of coauthors
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