Manuel J. Barragan Asian

Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez: Digital Adaptive Calibration of Multi-Step Analog to Digital Converters. J. Low Power Electronics 8(2): 182-196 (2012)

Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez: Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS. IEEE T. Instrumentation and Measurement 61(8): 2212-2221 (2012)

Manuel J. Barragan Asian, Gildas Leger, José L. Huertas: OBT for settling error test of sampled-data systems using signal-dependent clocking. European Test Symposium 2012: 1-6

Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas: Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures. J. Electronic Testing 27(3): 277-288 (2011)

Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications. J. Electronic Testing 27(3): 305-320 (2011)

Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas: Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. Asian Test Symposium 2011: 359-364

Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: A BIST Solution for Frequency Domain Characterization of Analog Circuits. J. Electronic Testing 26(4): 429-441 (2010)

Manuel J. Barragan Asian, Gloria Huertas, Adoración Rueda, José Luis Huertas: (Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems. DELTA 2010: 8-13

Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas: Low-cost signature test of RF blocks based on envelope response analysis. European Test Symposium 2010: 55-60

Antonio J. Ginés, Ricardo Doldán, Manuel J. Barragan Asian, Adoración Rueda, Eduardo J. Peralías: On-chip biased voltage-controlled oscillator with temperature compensation of the oscillation amplitude for robust I/Q generation. ISCAS 2010: 1979-1982

Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas: A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis. Asian Test Symposium 2009: 255-260

Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: Practical Implementation of a Network Analyzer for Analog BIST Applications. DATE 2008: 80-85

Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez: Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. DATE 2007: 1301-1306

Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35µm Technology. DDECS 2006: 119-124

Diego Vázquez, Gloria Huertas, África Luque, Manuel J. Barragan Asian, Gildas Leger, Adoración Rueda, José Luis Huertas: Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST. J. Electronic Testing 21(3): 221-232 (2005)