Joaquín Alvarado

Muthupandian Cheralathan, Esteban Contreras, Joaquín Alvarado, Antonio Cerdeira, Giuseppe Iannaccone, Enrico Sangiorgi, Benjamín Iñíguez: Implementation of nanoscale double-gate CMOS circuits using compact advanced transport models. Microelectronics Journal 44(2): 80-85 (2013)

Valeria Kilchytska, Joaquín Alvarado, S. Put, Nadine Collaert, Eddy Simoen, Cor Claeys, O. Militaru, G. Berger, Denis Flandre: High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs. Microelectronics Reliability 52(1): 118-123 (2012)

C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, D. Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin: Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Microelectronics Reliability 51(2): 326-331 (2011)

Joaquín Alvarado, E. Boufouss, Valeria Kilchytska, Denis Flandre: Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. Microelectronics Reliability 50(9-11): 1852-1856 (2010)

Joaquín Alvarado, Antonio Cerdeira, Valeria Kilchytska, Denis Flandre: Harmonic distortion analysis using an improved charge sheet model for PD SOI MOSFETs. Microelectronics Journal 38(3): 321-326 (2007)