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Dan Alexandrescu
2010 – today
- 2012
[c12]Shrikanth Ganapathy, Ramon Canal, Dan Alexandrescu, Enrico Costenaro, Antonio González, Antonio Rubio: A novel variation-tolerant 4T-DRAM cell with enhanced soft-error tolerance. ICCD 2012: 472-477- [c11]Miguel Vilchis, Ramnath Venkatraman, Enrico Costenaro, Dan Alexandrescu: A real-case application of a synergetic design-flow-oriented SER analysis. IOLTS 2012: 43-48
- [c10]Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro: RIIF - Reliability information interchange format. IOLTS 2012: 103-108
- [c9]Dan Alexandrescu, Enrico Costenaro: Towards optimized functional evaluation of SEE-induced failures in complex designs. IOLTS 2012: 182-187
- 2011
- [c8]Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis: A Practical Approach to Single Event Transients Analysis for Highly Complex Designs. DFT 2011: 155-163
- [c7]Enrico Costenaro, Massimo Violante, Dan Alexandrescu: A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories. IOLTS 2011: 49-54
- [c6]Dan Alexandrescu: A comprehensive soft error analysis methodology for SoCs/ASICs memory instances. IOLTS 2011: 175-176
- 2010
- [c5]Mehdi Baradaran Tahoori, Ishwar Parulkar, Dan Alexandrescu, Kevin Granlund, Allan Silburt, Bapi Vinnakota: Panel: Reliability of data centers: Hardware vs. software. DATE 2010: 1620
2000 – 2009
- 2009
- [c4]Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schäfer, Cyrille Beltrando: Highs and lows of radiation testing. IOLTS 2009: 179
- 2008
- [c3]Shi-Jie Wen, Dan Alexandrescu, Renaud Perez: A Systematical Method of Quantifying SEU FIT. IOLTS 2008: 109-114
- [c2]Michael Nicolaidis, Renaud Perez, Dan Alexandrescu: Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. VTS 2008: 371-376
- 2004
- [j1]Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis: Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. J. Electronic Testing 20(4): 413-421 (2004)
- 2002
- [c1]Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis: New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. DFT 2002: 99-107
Coauthor Index
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last updated on 2012-12-20 00:23 CET by the dblp team